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Auto-deep scan for capacitive sensing

  • US 20050253597A1
  • Filed: 05/14/2004
  • Published: 11/17/2005
  • Est. Priority Date: 05/14/2004
  • Status: Active Grant
First Claim
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1. A method of finding a feature behind a surface using a sensor having first and second plates, the method comprising the acts of:

  • moving the sensor and surface adjacent one another;

    measuring a first capacitance of a first capacitor including the first plate and the feature;

    measuring a second capacitance of a second capacitor including the second plate and the feature;

    computing a ratio of the first and second capacitance measurements; and

    comparing one of the first or second capacitance measurements with a first threshold, thereby to determine an indication of a depth of the feature.

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