System and method of workload-dependent reliability projection and monitoring for microprocessor chips and systems
First Claim
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1. A system for projecting reliability, comprising:
- a module which includes workload inputs which account for activity on the module; and
a reliability module interacting with the module to determine a reliability measurement for the module in real-time based upon the workload inputs and a measured operational quantity of the module.
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Abstract
A system and method for projecting reliability includes a module, such as a chip, which includes workload inputs, which account for activity on the chip. A reliability module interacts with the chip to determine a reliability measurement for the chip based upon the workload inputs such that functions of the chip are altered based upon the reliability measurement. The reliability measurements are employed to rate or improve chip designs or calculate a reliability measure in real-time.
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Citations
25 Claims
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1. A system for projecting reliability, comprising:
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a module which includes workload inputs which account for activity on the module; and
a reliability module interacting with the module to determine a reliability measurement for the module in real-time based upon the workload inputs and a measured operational quantity of the module. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A method for designing a module or system of modules based upon projected reliability, comprising the steps of:
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simulating a module response based upon design information;
estimating module activity based upon a workload trace;
converting the module response and the module activity to failure rate data; and
analyzing a design of the module based upon the failure rate data. - View Dependent Claims (11, 12, 13, 14, 15)
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16. A method for monitoring a module or system of modules based upon projected reliability, comprising the steps of:
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determining physical responses of a module during operation, the responses including module activity;
converting the physical responses of the module to failure rate data by performing reliability evaluations based upon the physical responses; and
determining a reliability projection based on the failure rate data. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24, 25)
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Specification