Method for measuring a spectrum of a sample by means of an infrared spectrometer and infrared spectrometer of this type

• US 20050259250A1
• Filed: 05/16/2005
• Published: 11/24/2005
• Est. Priority Date: 05/19/2004
• Status: Abandoned Application

• Current Assignee: Bruker Optik Gmbh (Bruker Corporation)
• Original Assignee: Bruker Optik Gmbh (Bruker Corporation)
• Inventors: Simon, Arno
• Application Number:
  US11/130,435
• Publication Number:
  US 20050259250A1
• Time in Patent Office: Days
• US Class Current: 356/300
• CPC Class Codes: G01J 1/0252 Constructional arrangements for compensating for fluctuations caused by, e.g. temperature, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a photometer; Purge systems, cleaning devices protection against electromagnetic interferences G01J2001/0276
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51
• CPC Class Codes: G01J 3/45 Interferometric spectrometry

Abstract

A method for measuring a spectrum of a sample by means of an infrared spectrometer is described, the spectrometer comprising at least one component whose operating behavior is influenced by at least one operating parameter which, in the event of a change, changes the operating behavior of the at least one component and thereby influences the spectrum to be measured, the method comprising detecting the at least one operating parameter at least once during the measurement of the spectrum, reckoning back the operating behavior of the at least one component in a manner dependent on the detected operating parameter to a predetermined reference value of the operating parameter, and further conducting at least one of the following steps: measuring the spectrum on the basis of the predetermined reference value of the operating parameter, correcting the spectrum on the basis of the predetermined reference value of the operating parameter.

Claims

1. A method for measuring a spectrum of a sample by means of an infrared spectrometer, said spectrometer comprising at least one component whose operating behavior is influenced by at least one operating parameter which, in the event of a change, changes said operating behavior of said at least one component and thereby influences said spectrum to be measured, the method comprising

detecting said at least one operating parameter at least once during the measurement of said spectrum,

reckoning back said operating behavior of said at least one component in a manner dependent on said detected operating parameter to a predetermined reference value of said operating parameter, and further conducting at least one of the following steps:

measuring said spectrum on the basis of said predetermined reference value of said operating parameter,

correcting said spectrum on the basis of said predetermined reference value of said operating parameter.

2. The method of claim 1, further comprising detecting said at least one operating parameter continuously during the measurement of said spectrum.

3. The method of claim 1, wherein said at least one operating parameter is influenced by at least one ambient parameter, and further comprising detecting said at least one ambient parameter during the measurement of said spectrum.

4. The method of claim 3, wherein said at least one ambient parameter is the ambient temperature of said component.

5. The method of claim 3, wherein said at least one ambient parameter is the ambient temperature of said entire spectrometer.

6. The method of claim 3, wherein said at least one ambient parameter is the ambient pressure of said component.

7. The method of claim 3, wherein said at least one ambient parameter is the ambient pressure of said entire spectrometer.

8. The method of claim 3, wherein said ambient parameter is the ambient humidity of said component.

9. The method of claim 3, wherein said ambient parameter is the ambient humidity of said entire spectrometer.

10. The method of claim 1, wherein said at least one operating parameter is an intrinsic operating parameter of said at least one component.

11. The method of claim 10, wherein said at least one operating parameter is the temperature of said component.

12. The method of claim 10, wherein said at least one operating parameter is the pressure of said at least one component.

13. The method of claim 10, wherein said at least one operating parameter is the radiation amplitude of said at least one component.

14. The method of claim 10, wherein said at least one operating parameter is the current intensity applied to said component.

15. The method of claim 1, further comprising determining said operating behavior of said at least one component in a manner dependent on said at least one operating parameter prior to the measurement of said spectrum.

16. The method of claim 15, further comprising determining said operating behavior of said at least one component in a manner dependent on a change in said at least one operating parameter on the basis of a reference sample with a known spectrum.

17. The method of claim 1, wherein said correcting of said spectrum is performed during the measurement of said spectrum.

18. The method of claim 1, wherein said correcting of said spectrum is performed after the measurement of said spectrum.

19. The method of claim 1, further comprising determining the dependence of said operating behavior of said at least one component on said at least one operating parameter in the vicinity of said predetermined reference value of said operating parameter.

20. The method of claim 19, further comprising calibrating said spectrometer to said predetermined reference value prior to the measurement of said spectrum.

21. The method of claim 1, said at least one component being at least one of the following:

a detector of said spectrometer, a measurement light source of said spectrometer, a reference light source of said spectrometer.

22. An infrared spectrometer for measuring a spectrum of a measurement sample, said spectrometer comprising at least one component whose operating behavior is sensitive towards a change in at least one operating parameter, further comprising first means for detecting said at least one operating parameter, and second means for reckoning back said operating behavior of said at least one component, in a manner dependent on said detected operating parameter.

23. The spectrometer of claim 22, further comprising means for correcting said spectrum in a manner dependent on said detective operating parameter.