Apparatus, methods, and systems to detect an analyte based on changes in a resonant frequency of a spring element
First Claim
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1. A microelectromechanical system sensor, comprising:
- a spring element;
a sensing material on the spring element; and
a detector adapted to determine a resonant frequency associated with the spring element, wherein the resonant frequency changes upon the exposure of the sensing material to an analyte.
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Abstract
According to some embodiments, a Microelectromechanical System (MEMS) sensor includes a sensing material on a spring element. The sensor may also include a detector adapted to determine a resonant frequency associated with the spring element, wherein the resonant frequency changes upon the exposure of the sensing material to an analyte.
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Citations
43 Claims
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1. A microelectromechanical system sensor, comprising:
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a spring element;
a sensing material on the spring element; and
a detector adapted to determine a resonant frequency associated with the spring element, wherein the resonant frequency changes upon the exposure of the sensing material to an analyte. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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27. A method of producing a microelectromechanical system sensor, comprising:
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forming a first insulating layer of a first side of a silicon wafer;
forming a second insulating layer on a second side of the silicon wafer, the second side being opposite the first side;
depositing and patterning of current carrying conductor on the first insulating layer on the first side of the silicon wafer;
etching away an area of the second insulating layer;
etching away a portion of the silicon wafer associated with the area to form a cavity substantially reaching the first insulating layer; and
forming a sensing layer on the first insulating layer proximate to the cavity, wherein the sensing layer is to change a resonant frequency of the first insulating layer proximate to the cavity upon exposure to an analyte; and
providing a sensing material for the sensing layer. - View Dependent Claims (28, 29, 30, 31)
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32. A microelectromechanical system sensor, comprising:
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a spring element;
a sensing material on the spring element; and
a detector adapted to determine a resonant frequency associated with the spring element, wherein the resonant frequency changes upon the exposure of the sensing material to an analyte, and wherein the detector includes;
a conducting path through which an alternating current is to flow, and a magnet having a magnetic field substantially normal to direction of current flow through the conducting path;
a reference spring element; and
a reference detector adapted to determine a reference resonant frequency associated with the reference spring element, wherein the reference resonant frequency does not change upon the exposure of the reference spring element to the analyte. - View Dependent Claims (33, 34, 35, 36, 37, 38)
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39. A method of detecting an analyte, comprising:
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determining a resonant frequency associated with a spring element having a sensing material; and
based on the resonant frequency, detecting the presence of the analyte. - View Dependent Claims (40)
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41. A method of producing a microelectromechanical system sensor, comprising:
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forming a first insulating layer of a first side of a silicon wafer;
forming a second insulating layer on a second side of the silicon wafer, the second side being opposite the first side;
depositing and patterning of current carrying conductor on the first insulating layer on the first side of the silicon wafer;
etching away an area of the second insulating layer;
etching away the silicon wafer associated with the area to form a cavity that reaches the first insulating layer; and
forming a sensing layer on the first insulating layer proximate to the cavity, wherein the sensing layer is to change a resonant frequency of the first insulating layer proximate to the cavity upon exposure to an analyte.
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42. A system, comprising:
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a microelectromechanical system sensor, including;
a spring element, a sensing material on the spring element, and a detector adapted to determine a resonant frequency associated with the spring element, wherein the resonant frequency changes upon the exposure of the sensing material to an analyte; and
a sensor dependent device. - View Dependent Claims (43)
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Specification