Circuit analyzing method and circuit analyzing device
First Claim
1. A circuit analyzing device comprising:
- a capacitance value extracting unit for extracting a capacitance value of a functional element from design information including layout information of a semiconductor integrated circuit; and
a capacitance value outputting unit for displaying the functional element in the semiconductor integrated circuit or a functional-element connecting wiring linked to the functional element on a design drawing including the layout information of the semiconductor integrated circuit in a discriminating manner in accordance with the capacitance value of the functional element.
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Accused Products
Abstract
A circuit analyzing device according to the present invention comprises a capacitance value extracting unit for extracting a capacitance value of a functional element from design information including layout information of a semiconductor integrated circuit and a capacitance value outputting unit for displaying the functional element in the semiconductor integrated circuit or a functional-element connecting wiring linked to the functional element on a design drawing including the layout information of the semiconductor integrated circuit in a discriminating manner in accordance with the capacitance value of the functional element, or comprises a per-attribute capacitance value operation unit for executing an operation of the capacitance value per attribute based on a functional-element attribute library in which attribute information of the functional element in the semiconductor integrated circuit is stored and the capacitance value of the functional element and a per-attribute capacitance value outputting unit for outputting the capacitance value per attribute calculated by the per-attribute capacitance value operation unit.
11 Citations
50 Claims
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1. A circuit analyzing device comprising:
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a capacitance value extracting unit for extracting a capacitance value of a functional element from design information including layout information of a semiconductor integrated circuit; and
a capacitance value outputting unit for displaying the functional element in the semiconductor integrated circuit or a functional-element connecting wiring linked to the functional element on a design drawing including the layout information of the semiconductor integrated circuit in a discriminating manner in accordance with the capacitance value of the functional element. - View Dependent Claims (8, 11, 14, 17, 20, 23, 26, 39, 40, 41, 42, 43, 44)
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2. A circuit analyzing device comprising:
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a capacitance value extracting unit for extracting a capacitance value of a functional element from design information including layout information of a semiconductor integrated circuit; and
a capacitance value/attribute outputting unit for outputting the capacitance value and an attribute of each functional element based on a functional-element attribute library in which attribute information of the functional element in the semiconductor integrated circuit is stored and the capacitance value of the functional element. - View Dependent Claims (4, 9, 12, 15, 18, 21, 24, 27, 29, 31, 33, 35, 37)
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3. A circuit analyzing device comprising:
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a capacitance value extracting unit for extracting a capacitance value of a functional element from design information including layout information of a semiconductor integrated circuit;
a per-attribute capacitance value operation unit for executing an operation of the capacitance value per attribute based on a functional-element attribute library in which attribute information of the functional element in the semiconductor integrated circuit is stored and the capacitance value of the functional element; and
a per-attribute capacitance value outputting unit for outputting the capacitance value per attribute calculated by the per-attribute capacitance value operation unit. - View Dependent Claims (5, 6, 7, 10, 13, 16, 19, 22, 25, 28, 30, 32, 34, 36, 38)
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45. A circuit analyzing device comprising:
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a capacitance value extracting unit for extracting a capacitance value of an output terminal of a functional element from design information including layout information of a semiconductor integrated circuit; and
a capacitance value outputting unit for displaying the functional element in the semiconductor integrated circuit or a functional-element connecting wiring linked to the functional element on a design drawing including the layout information of the semiconductor integrated circuit in a discriminating manner in accordance with the capacitance value of the output terminal of the functional element.
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46. A circuit analyzing device comprising:
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a capacitance value extracting unit for extracting a capacitance value of an output terminal of a functional element from design information including layout information of a semiconductor integrated circuit; and
a capacitance value/attribute outputting unit for outputting the capacitance value and an attribute of the output terminal of each functional element based on a functional-element attribute library in which attribute information of the output terminal of each functional element in the semiconductor integrated circuit is stored and the capacitance value of the output terminal of the functional element.
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47. A circuit analyzing device comprising:
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a capacitance value extracting unit for extracting a capacitance value of an output terminal of a functional element from design information including layout information of a semiconductor integrated circuit;
a per-attribute capacitance value operation unit for executing an operation of the capacitance value per attribute based on a functional-element attribute library in which attribute information of the output terminal of the functional element in the semiconductor integrated circuit is stored and the capacitance value of the output terminal of the functional element; and
a per-attribute capacitance value outputting unit for outputting the per-attribute capacitance value calculated by the per-attribute capacitance value operation unit.
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48. A circuit analyzing method comprising:
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a capacitance value extracting step in which a capacitance value of a functional element is extracted from design information including layout information of a semiconductor integrated circuit; and
a capacitance value outputting step in which the functional element or a functional-element connecting wiring is displayed on a design drawing including the layout information of the semiconductor integrated circuit in a discriminating manner based on the capacitance value of the functional element in the semiconductor integrated circuit.
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49. A circuit analyzing method comprising:
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a capacitance value extracting step in which a capacitance value of a functional element is extracted from design information including layout information of a semiconductor integrated circuit; and
a capacitance value/attribute outputting step in which the capacitance value and an attribute of each functional element are outputted based on a functional-element attribute library in which attribute information of the functional element in the semiconductor integrated circuit is stored and the capacitance value of the functional element.
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50. A circuit analyzing method comprising:
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a capacitance value extracting step in which a capacitance value of a functional element is extracted from design information including layout information of a semiconductor integrated circuit;
a per-attribute capacitance value operation step in which an operation of the capacitance value is executed per attribute based on a functional-element attribute library in which attribute information of the functional element in the semiconductor integrated circuit is stored and the capacitance value of the functional element; and
a per-attribute capacitance value outputting step in which a result of the operation per attribute executed in the per-attribute capacitance value operation step is outputted.
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Specification