Automated and customizable generation of efficient test programs for multiple electrical test equipment platforms
First Claim
1. A method of forming a test package for analyzing characteristics of a semiconductor sample via an electrical tester machine, the method comprising:
- identifying a plurality of test algorithms, each test algorithm defining a semiconductor device test;
populating a test package with the plurality of test algorithms, wherein each test algorithm comprises parameter data fields for populating with validated parameter data values;
searching at least one catalog for the validated parameter data values; and
in response to finding at least one validated parameter data value, populating the at least one validated parameter data value into the test package.
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Abstract
Automating techniques provide a way to create efficient test programs for characterizing semiconductor devices, such as those on a silicon die sample. Typically, test program creation is a drawn out process involving data entry for every test to be run as part of the test program. The described techniques improve test algorithm selection and automatically populate the test algorithm data in creating the test program. The automatic population may occur by accessing test structure, header, and test algorithm catalogs. The test structure catalog contains physical data for the test program, while the header catalog contains global parameter values. The test algorithm catalog has all of the various test algorithms that may be run in a given test, where these test algorithms may be in a template form and specific to any number of different test language abstractions. After test program creation, a validation process is executed to determine if the test program data is valid. Invalid data may be flagged, in an example. Once validated, techniques are described for converting the validated test program into an executable form, by formatting the various test algorithm data in the test program into a form compatible with the applicable test language abstraction selected by the user or the tester.
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Citations
30 Claims
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1. A method of forming a test package for analyzing characteristics of a semiconductor sample via an electrical tester machine, the method comprising:
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identifying a plurality of test algorithms, each test algorithm defining a semiconductor device test;
populating a test package with the plurality of test algorithms, wherein each test algorithm comprises parameter data fields for populating with validated parameter data values;
searching at least one catalog for the validated parameter data values; and
in response to finding at least one validated parameter data value, populating the at least one validated parameter data value into the test package. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A method of forming a test program for analyzing characteristics of a semiconductor sample via an electrical tester machine, the method comprising:
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creating a test package having a plurality of test algorithms, wherein one of the plurality of test algorithms corresponds to a first test code template and wherein at least one other of the plurality of test algorithms corresponds to a second test code template;
different than the first test code template;
populating the test package with parameter data values; and
validating the parameter data values. - View Dependent Claims (19, 20, 21)
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22. An article comprising a machine-accessible medium having stored thereon instructions that, when executed by a machine, cause the machine to:
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identify a plurality of selected test algorithms, wherein each test algorithm defines a semiconductor device test;
populate a test package with the plurality of selected test algorithms;
search a catalog for validated parameter data values for populating into the test package; and
populating validated parameter data values into the test package. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30)
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Specification