Method of forming a field effect transistor
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Accused Products
Abstract
The invention includes methods of forming field effect transistors. In one implementation, a method of forming a field effect transistor having a gate comprising a conductive metal or metal compound received over conductively doped semiconductive material includes forming transistor gate semiconductive material into a gate line over a semiconductive material channel region. The gate line includes semiconductive material sidewalls. The semiconductive material sidewalls of the gate line are oxidized. After the oxidizing, at least one of a conductive metal or metal compound is formed in electrical connection with the transistor gate semiconductive material to comprise a substantially coextensive elongated portion of a final construction of the gate line of the field effect transistor being formed.
12 Citations
67 Claims
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1-43. -43. (canceled)
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44. A method of forming a field effect transistor having a gate comprising a conductive metal or metal compound received over conductively doped semiconductive material, the method comprising:
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forming transistor gate semiconductive material into a gate line over a semiconductive material channel region, the gate line comprising semiconductive material sidewalls;
oxidizing the semiconductive material sidewalls of the gate line;
after the oxidizing, depositing insulative material over the gate line;
after the depositing, removing the insulative material effective to expose the gate line; and
after the removing, forming at least one of a conductive metal or metal compound in electrical connection with the transistor gate semiconductive material to comprise a substantially coextensive elongated portion of a final construction of the gate line of the field effect transistor being formed, the forming the at least one of a conductive metal or metal compound to comprise a substantially coextensive elongated portion of a final construction of the gate line of the field effect transistor being formed comprising deposition of said at least one and patterning and subtractively - View Dependent Claims (45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58)
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59. A method of forming a field effect transistor having a gate comprising a conductive metal or metal compound received over conductively doped semiconductive material, the method comprising:
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forming transistor gate semiconductive material over a semiconductive material channel region;
forming conductive masking material over the transistor gate semiconductive material;
forming the transistor gate semiconductive material and the conductive masking material into a gate line, the gate line comprising semiconductive material sidewalls;
oxidizing the semiconductive material sidewalls of the gate line;
after the oxidizing, depositing insulative material over the gate line;
after the depositing, removing the insulative material effective to expose the gate line; and
after the removing, forming at least one of a conductive metal or metal compound in electrical connection with the transistor gate semiconductive material to comprise a substantially coextensive elongated portion of a final construction of the gate line of the field effect transistor being formed. - View Dependent Claims (60, 61, 62, 63, 64, 65, 66, 67)
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Specification