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Method of peeling off and method of manufacturing semiconductor device

  • US 20050282357A1
  • Filed: 08/09/2005
  • Published: 12/22/2005
  • Est. Priority Date: 08/10/2001
  • Status: Active Grant
First Claim
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1. A semiconductor device manufacturing method comprising:

  • forming a first material layer having tensile stress over a substrate;

    forming a second material layer having a compressive stress over said first material layer;

    forming an insulating layer over said second material layer;

    forming an element over said insulating layer;

    sticking a supporting body to said element;

    subsequently peeling said supporting body from said substrate by physical means within said second material layer or in the interface of said second material layer; and

    sticking a transfer body to said insulating layer or said second material layer to sandwich said element between said supporting body and said transfer body.

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