Method of peeling off and method of manufacturing semiconductor device
First Claim
1. A semiconductor device manufacturing method comprising:
- forming a first material layer having tensile stress over a substrate;
forming a second material layer having a compressive stress over said first material layer;
forming an insulating layer over said second material layer;
forming an element over said insulating layer;
sticking a supporting body to said element;
subsequently peeling said supporting body from said substrate by physical means within said second material layer or in the interface of said second material layer; and
sticking a transfer body to said insulating layer or said second material layer to sandwich said element between said supporting body and said transfer body.
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Abstract
The invention aims to provide a peeling method without damaging a peeled off layer and to allow separation of not only a peeled off layer having a small surface area but also the entire surface of a peeled off layer having a large surface area. Further, the invention aims to provide a lightweight semiconductor device by sticking a peeled off layer to a variety of substrates and its manufacturing method. Especially, the invention aims to provide a lightweight semiconductor device by sticking a variety of elements such as TFT to a flexible film and its manufacturing method. Even in the case a first material layer 11 is formed on a substrate and a second material layer 12 is formed adjacently to the foregoing first material layer 11, and further, layered film formation, heating treatment at 500° C. or higher or laser beam radiating treatment is carried out, if the first material layer has a tensile stress before the peeling and the second material layer has a compressive stress, excellent separation can easily be carried out by physical means in the interlayer or interface of the second material layer 12.
101 Citations
19 Claims
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1. A semiconductor device manufacturing method comprising:
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forming a first material layer having tensile stress over a substrate;
forming a second material layer having a compressive stress over said first material layer;
forming an insulating layer over said second material layer;
forming an element over said insulating layer;
sticking a supporting body to said element;
subsequently peeling said supporting body from said substrate by physical means within said second material layer or in the interface of said second material layer; and
sticking a transfer body to said insulating layer or said second material layer to sandwich said element between said supporting body and said transfer body. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 18)
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9. A semiconductor device manufacturing method comprising:
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forming a first material layer over a substrate;
forming a second material layer having a compressive stress over said first material layer;
forming an insulating layer over said second material layer;
forming an element over said insulating layer;
sticking a supporting body to said element;
subsequently peeling said supporting body off said substrate by physical means within said second material layer or in the interface of said second material layer; and
sticking a transfer body to said insulating layer or said second material layer to sandwich said element between said supporting body and said transfer body. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17, 19)
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Specification