Probe for high speed scanning

• US 20050283990A1
• Filed: 12/05/2003
• Published: 12/29/2005
• Est. Priority Date: 12/05/2002
• Status: Active Grant

• Current Assignee: Renishaw PLC
• Original Assignee: Renishaw PLC
• Inventors: McFarland, Geoffrey, McMurtry, David Roberts
• Granted Patent: US 7,124,514 B2
• Time in Patent Office: Days
• US Class Current: 33/556
• CPC Class Codes: G01B 7/012 Contact-making feeler heads therefor

Abstract

A measurement probe (5) which comprises a housing (16) for mounting on an arm (6) of a coordinate positioning apparatus (2) and a stylus (10) mounted on a stylus support member (28). The stylus (10) and the stylus support member (28) are deflectable with respect to the housing (16). A first transducer system (40-48) measures movement of the stylus support member (28) relative to the arm (6) of the coordinate positioning apparatus (2). A second transducer system (38) measures movement of the stylus tip (12) relative to the stylus supporting member (28). A measurement of total stylus deflection is achieved by combining data from the first and second transducer systems.

Claims

1. A probe for use on a coordinate positioning apparatus comprising:

a housing attachable to an arm of the coordinate positioning apparatus and a stylus mounted on a stylus support member, said stylus having a tip, and said stylus and stylus support member being deflectable with respect to the housing;

a first transducer system which measures movement of the stylus support member relative to the arm of the coordinate positioning apparatus;

a second transducer system which measures movement of the tip of the stylus relative to the stylus supporting member;

a tip position calculator which combines outputs from the first and second transducer systems to provide a measurement of total stylus deflection.

2. A probe according to claim 1 wherein the first transducer system measures movement of the stylus support member relative to the arm of the coordinate positioning apparatus in at least three dimensions.

3. A probe according to claim 1 wherein the first transducer system measures transverse movement of the stylus support member relative to the arm of the coordinate positioning apparatus.

4. A probe according to claim 1 wherein the first transducer system has a range of less than 5 mm.

5. A probe according to claim 1 wherein the second transducer system measures movement of the tip of the stylus relative to the stylus supporting member in two dimensions.

6. A probe according to claim 1 wherein the second transducer system has a higher mechanical response than the first transducer system.

7. A probe according to claim 1 wherein the mechanical response of the second transducer system is at least five times higher than the mechanical response of the first transducer system.

8. A probe according to claim 1 wherein the second transducer system comprises at least one strain gauge.

9. A probe according to claim 8 wherein the at least one strain gauge comprises three strain gauges spaced at 120°

about the longitudinal axis of the stylus.

10. A probe according to claim 1 wherein the secondary transducer system is mounted on the stylus support member.

11. A probe according to claim 10 wherein the stylus support member is provided with deformable bridges onto which the secondary transducer system is mounted.

12. A probe according to claim 1 wherein the secondary transducer system is mounted on the stylus.

13. A probe according to claim 12 wherein the second transducer system is located near the tip of the stylus.

14. A probe according to claim 12 wherein the stylus is provided with a deformable tube onto which the secondary transducer system is mounted.

15. A probe according to claim 1 wherein the secondary transducer system comprises at least one transducer mounted on the stylus support member and at least one transducer mounted on the stylus and wherein readings from the at least two transducers are combined to provide the data from the secondary transducer system.

16. A probe according to claim 1 wherein the secondary transducer system is one of an optical, capacitance or inductance transducer.

17. A probe for use on a coordinate positioning apparatus comprising:

a housing attachable to an arm of the coordinate positioning apparatus and a stylus having a stylus tip, said stylus being deflectable with respect to the housing;

a first transducer system which measures movement of the stylus relative to the arm of the coordinate positioning apparatus;

a second transducer system which measures movement of the tip of the stylus relative to the first transducer system;

a tip position calculator which combines outputs from the first and second transducer systems to provide a measurement of total stylus deflection.

18. A method of measuring a surface of an object with a probe, said probe comprising a housing and a stylus mounted on a stylus support member, said stylus having a stylus tip, and said stylus and stylus support member being deflectable with respect to the housing, the method comprising the steps of:

mounting the probe on an arm of a coordinate positioning apparatus;

positioning the probe so that the stylus is in contact with the surface to be measured and moving the probe along said surface with the stylus remaining in contact with said surface;

obtaining data from a first transducer system which measures movement of the stylus supporting member relative to the arm of the coordinate positioning apparatus;

obtaining data from a second transducer system which measures movement of the tip of the stylus relative to the stylus supporting member;

and combining the data from the first and second transducer systems to produce a measurement of total probe deflection.