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Automated inspection systems and methods

  • US 20050286753A1
  • Filed: 06/25/2004
  • Published: 12/29/2005
  • Est. Priority Date: 06/25/2004
  • Status: Abandoned Application
First Claim
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1. A method for detecting defects in electronic displays, the method comprising:

  • providing image data for a test display, the image data comprising values for one or more characteristics of the test display as a function of spatial position on the test display and a set of reference vectors, the reference vectors generated from reference image data of one or more reference displays known to be good;

    generating from the image data a plurality of test vectors, each of the test vectors having a spatial part corresponding to a spatial position on the test display and a characteristic part;

    for each of the test vectors;

    identifying a subset of the set of reference vectors based upon at least the spatial part of the test vector; and

    , determining a degree of similarity between the test vector and one or more reference vectors of the subset of the set of reference vectors; and

    , identifying any of the test vectors for which the degree of similarity fails to satisfy a similarity criterion.

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