Method and apparatus for inspecting biological samples

• US 20050287678A1
• Filed: 06/08/2005
• Published: 12/29/2005
• Est. Priority Date: 06/08/2004
• Status: Active Grant

• Current Assignee: Microelectronic Systems Pty. Ltd.
• Original Assignee: Bizpac (Australia) Pty Ltd. (DiaSorin S.p.A.)
• Inventors: Morrison, Allan D.
• Granted Patent: US 8,273,579 B2
• Time in Patent Office: Days
• US Class Current: 436/164
• CPC Class Codes: G01N 21/8483 Investigating reagent band test-element handling not specific to a test method G01N33/4875; analytical elements specific to chemical analysis of biological material G01N33/52; autometer with reagent band G01N35/04

Abstract

A method of selecting for analysis a sample of a biological material anisotropically distributed on a substrate, said method comprising the steps of directing a beam of radiation onto said substrate, said radiation being selected to interact with said anisotropically distributed biological material to an extent corresponding to said anisotropy; measuring said interaction at plurality of locations on said substrate; and selecting said sample by reference to said measurements. An inspection apparatus for selecting for analysis a sample of a biological material anisotropically distributed on a substrate is also disclosed. The apparatus comprises a source of radiation selected to direct a beam of radiation onto said substrate, said radiation being selected to interact with said anisotropically distributed biological material to an extent corresponding to said anisotropy; a detector for measuring said interaction at plurality of locations on said substrate; and a processor coupled to the detector for utilising the measurement at each of said plurality of locations to select a portion of said sample for further analysis.

Claims

1. A method of selecting for analysis a sample of a biological material anisotropically distributed on a substrate, said method comprising the steps of:

directing a beam of radiation onto said substrate, said radiation being selected to interact with said anisotropically distributed biological material to an extent corresponding to said anisotropy;

measuring said interaction at plurality of locations on said substrate; and

selecting said sample by reference to said measurements.

2. The method of claim 1 wherein the radiation is selected for its absorptive, transmissive or reflective interaction with the anisotropically distributed biological material.

3. The method of claim 1 wherein the radiation is in the electromagnetic spectrum (EMR).

4. The method of claim 3 wherein the EMR radiation is in the visible spectrum and is of a selected bandwidth.

5. The method of claim 1 wherein the measuring step is determined by the selection of radiation and the nature of the interaction with the sample.

6. The method of claim 1 wherein the sample comprises a blood specimen absorbed onto filter paper or like substrate and the measuring step utilises a detector of either reflected or transmitted spectrum of an incident light source.

7. The method of claim 6 wherein transmission through the specimen and the substrate of light from the light source, such as a light emitting diode (LED), is detected by a photodiode responding to a suitable wavelength.

8. The method of claim 6 wherein measuring the interaction at a plurality of locations on the substrate is achieved by evenly illuminating the substrate and the plurality of locations scanned by a scanning detector of transmission or reflection.

9. The method of claim 6 wherein measuring of the interaction at a plurality of locations on the substrate is achieved by scanning a single point light source over the substrate in register with the scanning detector.

10. The method of claim 9 wherein, for reflective measurement, the point source and the detector are integrated in the same device.

11. The method of claim 8 wherein the measuring of the interaction utilises an array of sources each element of which array of sources is associated with a discrete detector.

12. The method of claim 6 wherein there is provided a single light source providing a pixellated incident radiation by means of a shadow mask, and the detection being either by multiple detectors in register with the shadow mask or by a scanning detector.

13. The method of claim 12 wherein the radiation and the detection may be quantized to pixels of a size corresponding to the sample size to be punched out of the substrate for analysis.

14. The method of claim 1 wherein the substrate is analysed from either one or both sides.

15. The method of claim 1 wherein measurements from the respective positions are used to generate a three dimensional array of measurements where the X and Y directions of the array correspond to a two dimensional surface of the substrate and the Z direction corresponds to the measurement at each location.

16. The method of claim 15 further comprising the provision of a readable plot from the array of measurements, which plot can direct an operator to a candidate sample site for manual extraction of the sample.

17. The method of claim 15 wherein the array of measurements are integrated by processing to form an output that factors the sample size to direct automated sampling apparatus to take the sample.

18. The method of claim 4 wherein, in the case of polychromatic sources, the frequency or bandwidth is provided by any suitable means such as a filter, grating or other monochromator.

19. The method of claim 4 wherein the bandwidth or frequency reaching the detector may be selected by filter, grating or other monochromator after interaction with the sample.

20. An inspection apparatus for selecting for analysis a sample of a biological material anisotropically distributed on a substrate, said apparatus comprising:

a source of radiation selected to direct a beam of radiation onto said substrate, said radiation being selected to interact with said anisotropically distributed biological material to an extent corresponding to said anisotropy;

a detector for measuring said interaction at plurality of locations on said substrate; and

a processor coupled to the detector for utilising the measurement at each of said plurality of locations to select a portion of said sample for further analysis.

21. The apparatus of claim 20 wherein the source of radiation is a light source and the detector measures the intensity of light.

22. The apparatus of claim 21 wherein the light source takes the form of an array of light emitting diodes (LEDs).

23. The apparatus of claim 21 wherein the detector is a photo-electric device, capable of measuring the intensity of light incident at a plurality of pixels, and measurements are made at a plurality of predetermined locations, corresponding to said respective pixels.

24. The apparatus of claim 20 further comprising a focussing arrangement, such as a lens, is provided for focussing reflected or transmitted radiation onto the detector.

25. The apparatus of claim 20 further comprising a director for directing electromagnetic radiation emanating from said source.

26. The apparatus of claim 25 wherein the director takes the form of an aperture, a series of mirrors and/or an optical fibre through which electromagnetic radiation is passed prior to impinging on the media.

27. The apparatus of claim 26 wherein the size of the aperture corresponds to a desired size or area of said portion of the sample.

28. The apparatus of claim 25 wherein the radiation director and the detector are fixed to a common support member that is movable relative to the media.

29. The apparatus of claim 20 wherein the support member has a substantially C-shaped section wherein the source and the detector are fixed to respective opposing ends of the C section.

30. The apparatus of claim 28 wherein the support member has a substantially C-shaped section wherein the source and director combination and the detector are fixed to respective opposing ends of the C section.

31. The apparatus of claim 28 wherein the source and director combination and the light detector are located adjacent to one another on the support member, whereby light reflected from an obverse face of the media may be detected.

32. The apparatus of claim 31 wherein the detector is placed adjacent to a reverse face of the media, preferably disposed opposite to the direction of the electromagnetic radiation incident on said obverse face of the media.

33. The apparatus of claim 20 wherein the inspection apparatus is co-located with a sampling apparatus for removing said portion of the sample from the media, preferably on a support member for a punching head and die.

34. The apparatus of claim 21 comprising:

a further light source disposed in lateral relation with said detector, whereby light reflected from the sample may be measured; and

a light barrier placed between the further light source and the adjacent detector.