Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
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Abstract
A method and apparatus for conditioning and monitoring a planarizing medium used for planarizing a microelectronic substrate. In one embodiment, the apparatus can include a conditioning body having a conditioning surface that engages a planarizing surface of the planarizing medium and is movable relative to the planarizing medium. A force sensor is coupled to the conditioning body to detect a frictional force imparted to the conditioning body by the planarizing medium when the conditioning body and the planarizing medium are moved relative to each other. The apparatus can further include a feedback device that controls the motion, position, or force between the conditioning body and the planarizing medium to control the conditioning of the planarizing medium.
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Citations
77 Claims
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1-66. -66. (canceled)
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67. A method for controlling conditioning of a planarizing medium used for planarizing a microelectronic substrate, the method comprising:
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engaging a conditioning body with the planarizing medium and moving at least one of the conditioning body and the planarizing medium relative to the other of the conditioning body and the planarizing medium while the conditioning body engages the planarizing medium;
detecting a frictional force between the conditioning body and the planarizing medium; and
controlling at least one of a force between the conditioning body and the planarizing medium and a speed of the conditioning body relative to the planarizing medium in response to detecting the frictional force between the conditioning body and the planarizing medium. - View Dependent Claims (68, 69, 70, 72, 73)
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71. (canceled)
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74. A method for monitoring a polishing pad used for planarizing a microelectronic substrate, the method comprising:
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engaging a conditioning body with a planarizing surface of the polishing pad;
applying a force to the polishing pad via the conditioning body;
moving at least one of the polishing pad and the conditioning body relative to the other of the polishing pad and the conditioning body; and
detecting a frictional force of the polishing pad on the conditioning body in a plane of the planarizing surface. - View Dependent Claims (75, 76, 77)
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Specification