Testing/adjusting method and test control apparatus for rotating disk storage devices

• US 20060009939A1
• Filed: 07/07/2005
• Published: 01/12/2006
• Est. Priority Date: 07/07/2004
• Status: Active Grant

• Current Assignee: Western Digital Technologies Incorporated (Western Digital Corporation)
• Original Assignee: Hitachi Global Storage Technologies Netherlands BV (Western Digital Corporation)
• Inventors: Suzuki, Hiroaki, Takase, Makoto, Kotani, Yasuhiro
• Granted Patent: US 7,584,070 B2
• Time in Patent Office: Days
• US Class Current: 702/108
• CPC Class Codes: G06F 11/2221 to test input/output devices or peripheral units
• CPC Class Codes: G11B 20/1816 Testing

Abstract

Embodiments of the invention provide a method of testing/adjusting magnetic disk devices, in which the method allows the tests/adjustments to be conducted by solving problems due to the data sizes and characteristics of test/adjustment programs. After assembly of a magnetic disk device, setup of various parameters, magnetic disk defect registration, and other test/adjustment steps are executed. Execution of the test/adjustment programs does not require a special test apparatus since they are executed in the magnetic disk device to be tested. In addition, the test/adjustment programs are formed up of multiple phases, and each phase is sequentially executed. Adoption of this program structure keeps the tests/adjustments clear from restrictions due to the data sizes and characteristics of the test/adjustment programs.

Claims

1. A method for testing/adjusting a rotating-disk-type storage device connected to a host device via a data transmission path, the method comprising:

the host device transferring the test/adjustment program of a first phase that is stored within the host device, to the rotating-disk-type storage device;

the rotating-disk-type storage device executing the test/adjustment program of the first phase;

the host device detecting that the rotating-disk-type storage device is requesting a transfer of the test/adjustment program of a second phase that is stored within the host device; and

in response to the request in the detecting, the host device transferring the test/adjustment program of the second phase to the rotating-disk-type storage device.

2. The testing/adjusting method according to claim 1, wherein the host device is a magnetic disk device operating in a host mode.

3. The testing/adjusting method according to claim 1, wherein the test/adjustment program of the first phase includes a program for writing servo information into the rotating-disk-type storage device.

4. The testing/adjusting method according to claim 1, wherein the test/adjustment program of the second phase includes a program for sending a command from the host device to the rotating-disk-type storage device and causing the rotating-disk-type storage device to execute the command.

5. The testing/adjusting method according to claim 1, wherein the host device and the rotating-disk-type storage device are magnetic disk devices and wherein the testing/adjusting method comprises:

the host device transferring the test/adjustment program of the first phase and the test/adjustment program of the second phase to the rotating-disk-type storage device; and

the rotating-disk-type storage device, after receiving the test/adjustment program of the first phase and the test/adjustment program of the second phase from the host device, writing both of the programs onto a magnetic disk.

6. A method for testing/adjusting a first magnetic disk device and a second magnetic disk device, both connected to a host device via a data transmission path, the method comprising:

the host device transferring the test/adjustment program of a first phase that is stored within the host device, to the first magnetic disk device and the second magnetic disk device;

the first magnetic disk device and the second magnetic disk device executing the test/adjustment program of the first phase;

the host device detecting that the first magnetic disk device or the second magnetic disk device is requesting a transfer of the test/adjustment program of a second phase that is stored within the host device; and

in response to the request in the detecting, the host device transferring the test/adjustment program of the second phase to the first or second magnetic disk device requesting the transfer of the test/adjustment program of the second phase.

7. The testing/adjusting method according to claim 6, wherein the data transmission path includes a SCSI bus.

8. The testing/adjusting method according to claim 6, wherein the data transmission path includes an arbitrated loop of a fiber channel or a fabric switch of a fiber channel.

9. The testing/adjusting method according to claim 6, wherein the data transmission path includes an ATA bus.

10. The testing/adjusting method according to claim 9, wherein the data transmission path includes a test control apparatus for connecting the host device, the first magnetic disk device, and the second magnetic disk device, and establishing a communication path for either the first magnetic disk device or the second magnetic disk device with respect to the host device.

11. The testing/adjusting method according to claim 10, wherein the test control apparatus is set as either a master or slave at one end, and wherein the first magnetic disk device and the second magnetic disk device are set as masters or slaves at the other end.

12. The testing/adjusting method according to claim 6, wherein the host device operates in a host mode.

13. A test control apparatus comprising:

a first ATA interface connector configured to connect a first magnetic disk device in which a test/adjustment program is stored;

a plurality of second ATA interface connectors each configured to connect any one of a plurality of second magnetic disk devices to be tested/adjusted;

a plurality of bus switches each connected to any one of the plural second ATA interface connectors at one end, and connected to the first ATA interface connector at the other end; and

a bus controller connected to the first ATA interface connector and any one of the bus switches so as to conduct control to close any one of the bus switches by executing a command transferred from the first magnetic disk device.

14. The test control apparatus according to claim 13, wherein the bus controller includes a device setter configured to set either a master or a slave.

15. The test control apparatus according to claim 13, wherein the bus switch includes a first bus switch and a second bus switch and wherein, when the first bus switch is in a closed condition and the second bus switch is in an open condition, the bus controller, by executing an ATA command sent from the first magnetic disk device, opens the first bus switch and closes the second bus switch.

16. The test control apparatus according to claim 15, wherein the bus switch includes a third bus switch and wherein, when the bus controller detects that the second magnetic disk device associated with the second bus switch is in a busy condition, the bus controller opens the second bus switch and closes the third bus switch.

17. The test control apparatus according to claim 15, wherein the bus switch includes a third bus switch and wherein, when the bus controller detects that neither the first magnetic disk device nor any of the second plural magnetic disk devices is connected to the second bus switch, the bus controller opens the second bus switch and closes the third bus switch.

18. The test control apparatus according to claim 13, further comprising a display section configured to display the fact that the second magnetic disk device has completed execution of the test/adjustment program.

19. The test control apparatus according to claim 13, further comprising a display section configured to display the fact that an error has occurred in the second magnetic disk device.

20. The test control apparatus according to claim 13, further comprising a display section configured to display an execution status of the test/adjustment program within the second magnetic disk device.