Apparatus and methods for analyzing samples

• US 20060012793A1
• Filed: 11/16/2004
• Published: 01/19/2006
• Est. Priority Date: 07/19/2004
• Status: Abandoned Application

• Current Assignee: Fluidigm Corporation
• Original Assignee: Helicos Biosciences Corporation
• Inventors: Harris, Timothy D.
• Application Number:
  US10/990,167
• Publication Number:
  US 20060012793A1
• Time in Patent Office: Days
• US Class Current: 356/436
• CPC Class Codes: G01N 21/552 Attenuated total reflection

Abstract

The present invention relates to apparatus, systems, and methods for analyzing biological samples. In particular, the invention provides systems and methods for analyzing samples in a light microscope. The invention allows microscopic position sensing and focusing. The invention includes the use of at least two coordinated beams of light, one of which operates to determine the position of the other. In a preferred embodiment, the system is a microscope having total internal reflection optics installed. Systems of the invention can also be constructed from a standard microscope configured with a total internal reflection objective.

Claims

1. A lighting system comprising:

a first light source for analyzing a sample of interest, light from the first light source defining a first optical path that is incident on the sample of interest; and

a second light source operating with the first light source for determining a position of the first optical path relative to the sample of interest.

2. The system of claim 1, wherein the angle of incidence of said first optical path with respect to the sample causes total internal reflection at the sample of light produced by said first light source.

3. The system of claim 2, further comprising a microscope having a total internal reflection objective positioned so as to observe the sample.

4. The system of claim 1, wherein said first light source is a fluorescent light source.

5. The system of claim 1, wherein the first light source and the second light source operate simultaneously.

6. The system of claim 1, wherein light from the second light source defines a second optical path at least partially coaxial with the first optical path.

7. The system of claim 1, wherein light from the second light source is directed to a position sensor for sensing an angle of incidence of the first optical path relative to the sample of interest.

8. The system of claim 7, wherein the position of the first optical path is adjusted to vary the angle of incidence at the sample of interest in response to a signal from the position sensor.

9. The system of claim 8, wherein the position of the first optical path is adjusted to obtain substantially total internal reflection of light from the first light source incident at the sample of interest.

10. The system of claim 1, wherein the first light source comprises a wavelength from about 390 nm to about 1550 nm.

11. The system of claim 1, wherein the second light source comprises infrared light.

12. The system of claim 1, wherein at least one of the first light source and the second light source is selected from the group consisting of a laser, a light emitting diode, and a lamp.

13. The system of claim 1, further comprising an imaging device for imaging the sample of interest.

14. The system of claim 1, further comprising a third light source for analyzing the sample of interest, light from the third light source defining a third optical path at least partially coaxial with the first optical path.

15. The system of claim 14, wherein the first light source and the third light source are operated simultaneously.

16. The system of claim 1, wherein the second light source continuously monitors the position of the first optical path.

17. The system of claim 1, adapted for use to detect a single molecule fluorescent event.

18. A method of substantially maintaining the relative orientation or a light source and sample of interest in a light-based microscope, the method comprising the steps of:

providing a first beam of light for intersecting with the sample of interest;

providing a second beam of light for determining a position of the first beam of light on the sample of interest;

directing the second beam of light onto a position sensor;

adjusting the relative orientation of the first beam of light and the sample of interest in response to a signal from the position sensor to vary an angle of incidence of the first beam of light with respect to the sample of interest to substantially maintain total internal reflection.

19. The method of claim 18, wherein the first beam of light is at least partially coaxial with the second beam of light.

20. The method of claim 18, further comprising the steps of continuously monitoring the orientation of the first beam of light and adjusting the relative angle of the first beam of light and the sample of interest in response thereto to substantially maintain total internal reflection

21. The method of claim 18, wherein the first beam detects a position of a molecule of interest.

22. The method of claim 18, wherein the first light source comprises a wavelength from about 390 nm to about 1550 nm.

23. The method of claim 18, wherein the second light source comprises an infrared light source.