Programmable particle scatterer for radiation therapy beam formation

• US 20060017015A1
• Filed: 09/24/2004
• Published: 01/26/2006
• Est. Priority Date: 07/21/2004
• Status: Active Grant

• Current Assignee: Mevion Medical Systems Incorporated
• Original Assignee: Still River Systems Incorporated
• Inventors: Gall, Kenneth, Sliski, Alan
• Granted Patent: US 7,208,748 B2
• Time in Patent Office: Days
• US Class Current: 250/492.300
• CPC Class Codes: A61N 2005/1087 Ions; Protons
• CPC Class Codes: A61N 2005/1095 Elements inserted into the radiation path within the system, e.g. filters or wedges
• CPC Class Codes: A61N 5/1077 Beam delivery systems
• CPC Class Codes: G21K 1/08 Deviation, concentration or focusing of the beam by electric or magnetic means electron-optical arrangements in electric discharge tubes H01J29/46; details, e.g. electric or magnetic deviating means for direct voltage accelerators or in accelerators using single pulses H05H5/02; arrangements for injecting particles into orbits H05H7/08; arrangements for ejecting particles from orbits H05H7/10
• CPC Class Codes: G21K 5/04 with beam-forming means
• CPC Class Codes: H05H 7/00 Details of devices of the types covered by groups H05H9/00, H05H11/00, H05H13/00

Abstract

Interposing a programmable path length of one or more materials into a particle beam modulates scattering angle and beam range in a predetermined manner to create a predetermined spread out Bragg peak at a predetermined range. Materials can be “low Z” and “high Z” materials that include fluids. A charged particle beam scatterer/range modulator can comprise a fluid reservoir having opposing walls in a particle beam path and a drive to adjust the distance between the walls of the fluid reservoir under control by a programmable controller. A “high Z” and, independently, a “low Z” reservoir, arranged in series, can be used. When used for radiation treatment, the beam can be monitored by measuring beam intensity, and the programmable controller can adjust the distance between the opposing walls of the “high Z” reservoir and, independently, the distance between the opposing walls of the “low Z” reservoir according to a predetermined relationship to integral beam intensity. Beam scattering and modulation can be done continuously and dynamically during a treatment in order to deposit dose in a target volume in a predetermined three dimensional distribution.

Claims

1. A charged particle beam scatterer/range modulator comprising:

high Z material having an adjustable path length in a particle beam path;

low Z material having an adjustable path length in the particle beam path; and

a programmable controller that independently adjusts the high Z and low Z path lengths during exposure of a target to the beam.

2. The scatterer/modulator of claim 1 wherein the high Z and the low Z materials are liquid.

3. The scatterer/modulator of claim 1 wherein the path length of the low Z material and, independently, the path length of the high Z material are continuously adjustable.

4. The scatterer/modulator of claim 1 wherein the charged particles are protons.

5. A radiation treatment apparatus, comprising:

a source of charged particles that provides a charged particle beam; and

a charged particle beam scatterer/range modulator, that includes

high Z material having an adjustable path length in a particle beam path;

low Z material having an adjustable path length in the particle beam path; and

a programmable controller that independently adjusts the high Z and low Z path lengths during exposure of a target to the beam.

6. The apparatus of claim 5 wherein the high Z and the low Z materials are liquid.

7. The apparatus of claim 5 wherein the path length of the low Z material and, independently, the path length of the high Z material are continuously adjustable.

8. The apparatus of claim 5 wherein the charged particles are protons.

9. The apparatus of claim 5 wherein the source is a cyclotron.

10. The apparatus of claim 9 wherein the cyclotron is a synchrocyclotron.

11. The apparatus of claim 5 further including

a beam monitor for measuring particle beam intensity, the beam monitor communicating beam intensity to the programmable controller, the programmable controller adjusting the low Z and, independently, the high Z path lengths according to integral beam intensity.

12. The apparatus of claim 11 wherein the programmable controller adjusts the low Z and, independently, the high Z path lengths continuously and dynamically.

13. A method of scattering and/or modulating a range of a changed particle beam, comprising:

directing a charged particle beam through a high Z material having an adjustable path length in a particle beam path;

directing the charged particle beam through a low Z material having an adjustable path length in the particle beam path; and

independently adjusting the high Z and low Z path lengths during exposure of a target to the beam under control by a programmable controller.

14. The method of claim 13 wherein the high Z and the low Z materials are liquid.

15. The method of claim 13 wherein the path length of the low Z material and, independently, the path length of the high Z material are continuously adjustable.

16. The apparatus of claim 13 wherein the charged particles are protons.

17. The method of claim 13 further including

measuring particle beam intensity;

and

with the programmable controller adjusting the low Z and, independently, the high Z path lengths according to beam intensity.

18. The method of claim 17 wherein the programmable controller adjusts the low Z and, independently, the high Z path lengths continuously and dynamically.

19. A method of treating a patient by directing a charged particle beam at a target within said patient, comprising:

producing a charged particle beam;

directing the charged particle beam through a high Z material having an adjustable path length in a particle beam path;

directing the charged particle beam through a low Z material having an adjustable path length in the particle beam path; and

independently adjusting the high Z and low Z path lengths during exposure of a target to the beam under control by a programmable controller.

20. The method of claim 19 wherein the high Z and the low Z materials are liquid.

21. The method of claim 19 wherein the path length of the low Z material and, independently, the path length of the high Z material are continuously adjustable.

22. The method of claim 19 wherein the charged particles are protons.

23. The method of claim 19 wherein the charged particle beam is produced by a cyclotron.

24. The method of claim 23 wherein the cyclotron is a synchrocyclotron.

25. The method of claim 19 further including

measuring beam intensity;

and

with the programmable controller adjusting the low Z and, independently, the high Z path lengths according to beam intensity.

26. A charged particle beam scatterer/range modulator comprising:

a fluid reservoir having opposing walls in a particle beam path;

a drive to adjust the distance between the walls of the fluid reservoir; and

a programmable controller for the drive to adjust the distance between the walls of the reservoir during exposure of a target to the beam.

27. The scatterer/modulator of claim 26 wherein the distance between the opposing walls of the reservoir is continuously adjustable.

28. The scatterer/modulator of claim 27 comprising a first and a second fluid reservoirs arranged in series in the particle beam path.

29. The scatterer/modulator of claim 28 wherein the distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir are continuously adjustable.

30. The scatterer/modulator of claim 29 further including a high Z material within the first reservoir and a low Z material within the second reservoir.

31. The scatterer/modulator of claim 26 wherein the charged particles are protons.

32. A radiation treatment apparatus, comprising:

a source of charged particles that provides a charged particle beam; and

a charged particle beam scatterer/range modulator that includes

a fluid reservoir having opposing walls in a particle beam path;

a drive to adjust the distance between the walls of the reservoir; and

a programmable controller for the drive to adjust the distance between the walls of the reservoir during exposure of a target to the beam.

33. The apparatus of claim 32 wherein the distance between the opposing walls of the reservoir is continuously adjustable.

34. The apparatus of claim 33 comprising a first and a second reservoirs arranged in series in the particle beam path.

35. The apparatus of claim 34 wherein the distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir are continuously adjustable.

36. The apparatus of claim 35 further including a high Z material within the first reservoir and a low Z material within the second reservoir.

37. The apparatus of claim 35 wherein the charged particles are protons.

38. The apparatus of claim 37 wherein the source is a cyclotron.

39. The apparatus of claim 38 wherein the cyclotron is a synchrocyclotron.

40. The apparatus of claim 35 further including

a beam monitor for measuring particle beam intensity,

the programmable controller adjusting the distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir according to beam intensity.

41. The apparatus of claim 40 wherein the programmable controller adjusts distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir continuously and dynamically.

42. A method of treating a patient by directing a charged particle beam at a target within said patient, comprising:

producing a charged particle beam;

directing the charged particle beam through a fluid reservoir having opposing walls in a particle beam path;

adjusting the distance between opposing walls of the fluid reservoir during exposure of a target to the beam under control of a programmable controller.

43. The method of claim 42 wherein the charged particle beam is directed through a first and a second reservoirs arranged in series in the particle beam path.

44. The method of claim 43 further including

continuously adjusting the distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir.

45. The method of claim 44 further including

measuring beam intensity;

and

communicating beam intensity to the programmable controller, wherein the programmable controller adjusts the distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir according to beam intensity.

46. The method of claim 45 wherein the first reservoir contains a high Z material within and the second reservoir contains a low Z material.

47. The method of claim 42 wherein the charged particles are protons.

48. The method of claim 42 wherein the charged particle beam is produced by a cyclotron.

49. The method of claim 48 wherein the cyclotron is a synchrocyclotron.

50. A radiation treatment apparatus, comprising:

a synchrocyclotron that provides a charged particle beam; and

a charged particle beam scatterer/range modulator, that includes

high Z material in an extraction channel of the synchrocyclotron having an adjustable path length in a particle beam path;

low Z material in an extraction channel of the synchrocyclotron having an adjustable path length in the particle beam path; and

a programmable controller that independently adjusts the high Z and low Z path lengths during exposure of a target to the beam.

51. The apparatus of claim 50 wherein the high Z and the low Z materials are liquid.

52. The apparatus of claim 50 wherein the path length of the low Z material and, independently, the path length of the high Z material are continuously adjustable.

53. The apparatus of claim 50 wherein the charged particles are protons.

54. The apparatus of claim 50 further including

a beam monitor for measuring particle beam intensity, the beam monitor communicating beam intensity to the programmable controller,

the programmable controller adjusting the low Z and, independently, the high Z path lengths according to integral beam intensity.

55. The apparatus of claim 54 wherein the programmable controller adjusts the low Z and, independently, the high Z path lengths continuously and dynamically.

56. A method of scattering and/or modulating a range of a changed particle beam, comprising:

producing a particle beam in a synchrocyclotron;

directing the charged particle beam through a high Z material having an adjustable path length in a particle beam path and disposed in an extraction channel of the synchrocyclotron;

directing the charged particle beam through a low Z material having an adjustable path length in the particle beam path and disposed in the extraction channel of the synchrocyclotron; and

independently adjusting the high Z and low Z path lengths during exposure of a target to the beam under control by a programmable controller.

57. The method of claim 56 wherein the high Z and the low Z materials are liquid.

58. The method of claim 56 wherein the path length of the low Z material and, independently, the path length of the high Z material are continuously adjustable.

59. The apparatus of claim 56 wherein the charged particles are protons.

60. The method of claim 56 further including

measuring particle beam intensity;

and

with the programmable controller adjusting the low Z and,

independently, the high Z path lengths according to beam intensity.

61. The method of claim 60 wherein the programmable controller adjusts the low Z and, independently, the high Z path lengths continuously and dynamically.

62. A radiation treatment apparatus, comprising:

a synchrocyclotron that provides a charged particle beam; and

a charged particle beam scatterer/range modulator that includes

a fluid reservoir disposed in an extraction channel of the synchrocyclotron and having opposing walls in a particle beam path;

a drive to adjust the distance between the walls of the reservoir; and

a programmable controller for the drive to adjust the distance between the walls of the reservoir during exposure of a target to the beam.

63. The apparatus of claim 62 wherein the distance between the opposing walls of the reservoir is continuously adjustable.

64. The apparatus of claim 63 comprising a first and a second reservoirs arranged in series in the particle beam path.

65. The apparatus of claim 64 wherein the distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir are continuously adjustable.

66. The apparatus of claim 65 further including a high Z material within the first reservoir and a low Z material within the second reservoir.

67. The apparatus of claim 65 wherein the charged particles are protons.

68. The apparatus of claim 65 further including

a beam monitor for measuring particle beam intensity,

the programmable controller adjusting the distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir according to beam intensity.

69. The apparatus of claim 68 wherein the programmable controller adjusts distance between the opposing walls of the first reservoir and, independently, the distance between the opposing walls of the second reservoir continuously and dynamically.