METHODS OF USING AND FABRICATING A SUPPORTING SUBSTRATE FOR THE DEPOSITION, AUTOMATED RECOGNITION, AND SPECTROSCOPIC IDENTIFICATION OF PARTICLES

• US 20060017919A1
• Filed: 09/19/2005
• Published: 01/26/2006
• Est. Priority Date: 05/31/2001
• Status: Active Grant

• Current Assignee: Unchained Labs Inc.
• Original Assignee: rap.ID Particle Systems GmbH (Unchained Labs Inc.)
• Inventors: Holz, Lothar, Lankers, Markus, Valet, Oliver
• Granted Patent: US 7,016,034 B2
• Time in Patent Office: Days
• US Class Current: 356/301
• CPC Class Codes: G01N 1/2205 with filters
• CPC Class Codes: G01N 15/0625 Optical scan of the deposits
• CPC Class Codes: G01N 21/65 Raman scattering
• CPC Class Codes: Y10T 428/249953 Composite having voids in a component [e.g., porous, cellular, etc.]
• CPC Class Codes: Y10T 428/31678 Of metal

Abstract

Methods of fabricating and using a supporting substrate for the deposition, automated recognition and spectroscopic identification of particulate impurities in liquid or gaseous media are disclosed wherein the supporting substrate comprises a filter membrane of polymer materials of a defined pore width, wherein the surface of the filter membrane is coated with metal which in the selected wavelength range for spectroscopic identification has no spectral features and at the selected excitation wavelength absorbs no or only little of the laser energy which is radiated in, and has a very smooth structure.

Claims

1. A method for identifying particles, said method comprising:

depositing at least one particle from a gaseous or liquid media onto a supporting substrate wherein said supporting substrate comprises a filter membrane of polymer materials of a defined pore width, and wherein said filter membrane includes a surface coated with a metal layer that has no spectral features in a wavelength range selected for spectroscopic identification and that absorbs no or only little of the laser energy which is radiated in at a selected excitation wavelength, the surface coating having a thickness of between about 50 and 200 nm, and having a very smooth structure with a roughness of less than 1 μ

m;

focusing said laser energy of said selected exciter wavelength onto said at least one deposited particle as part of said spectroscopic identification;

collecting backscattered light from said at least one deposited particle;

filtering out said at least one exciter wavelength from said collected light;

generating a spectrum of said filtered light using spectroscopic analysis techniques; and

identifying a chemical composition of said at least one deposited particle in response to said generated spectrum.

2. The method of claim 1 wherein said metal layer is selected from the group consisting of:

nickel, aluminum, palladium, platinum, tungsten, iron, tantalum, rhodium, cadmium, copper, gold, silver, indium, cobalt, tin, silicon, germanium, tellurium, selenium and alloys thereof.

3. The method of claim 1 wherein said metal layer is vapor-deposited.

4. The method of claim 1 wherein said filter membrane comprises polycarbonate, polytetrafluoroethylene or cellulose acetate.

5. The method of claim 1 wherein said defined pore width is between about 0.2 and 1.2 μ

m.

6. The method of claim 1 wherein said spectroscopic identification is effected by Raman spectroscopy.

7. A method of fabricating a supporting substrate used for the deposition, automated recognition, and spectroscopic identification of particulate impurities in liquid or gaseous media, said method comprising:

generating a filter membrane of polymer materials of a defined pore width; and

vapor-depositing a metal layer onto a surface of said filter membrane, and wherein said metal layer has no spectral features in a wavelength range selected for spectroscopic identification and that absorbs no or only little of the laser energy which is radiated in at a selected excitation wavelength, the surface coating having a thickness of between about 50 and 200 nm, and having a very smooth structure with a roughness of less than 1 μ

m.

8. The method of claim 7 wherein said metal layer is selected from the group consisting of:

nickel, aluminum, palladium, platinum, tungsten, iron, tantalum, rhodium, cadmium, copper, gold, silver, indium, cobalt, tin, silicon, germanium, tellurium, selenium and alloys thereof.

9. The method of claim 7 wherein said filter membrane comprises polycarbonate, polytetrafluoroethylene or cellulose acetate.

10. The method of claim 7 wherein said defined pore width is between about 0.2 and 1.2 μ

m.

11. The method of claim 7 wherein said spectroscopic identification is effected by Raman spectroscopy.