X-ray diffraction screening system convertible between reflection and transmission modes
First Claim
1. An X-ray diffraction apparatus for analyzing a sample on a sample holder, the apparatus comprising:
- a mounting assembly that maintains the sample holder along a horizontal axis, such that one side of the sample holder is located to a first side of the axis and an opposite side of the sample holder is located to a second side of the axis;
an X-ray source that directs X-ray energy toward the sample holder;
an X-ray detector that detects X-ray energy diffracted from the sample; and
a movement assembly that allows movement of one of the source and detector along a predetermined path between a first position, in which the source and detector are on same side of the horizontal axis, and a second position, in which the source and detector are on opposite sides of the horizontal axis from each other.
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Accused Products
Abstract
An X-ray diffraction apparatus provides analysis in either transmission or reflective mode and easy conversion between the two modes. An X-ray source and X-ray detector are each connected to a different circle of a goniometer. The two circles may be rotated independently to position the source and detector on the same side of a sample library for reflection mode operation, or on opposite sides of the sample library for transmission mode operation. The sample library has a horizontal orientation that allows open sample containers of the library to maintain the sample without spillage, and it connects to an XYZ stage that can move in three dimensions. The system may use a beamstop, and the goniometer and XYZ stage be motorized and controlled for automated sample analysis.
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Citations
30 Claims
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1. An X-ray diffraction apparatus for analyzing a sample on a sample holder, the apparatus comprising:
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a mounting assembly that maintains the sample holder along a horizontal axis, such that one side of the sample holder is located to a first side of the axis and an opposite side of the sample holder is located to a second side of the axis;
an X-ray source that directs X-ray energy toward the sample holder;
an X-ray detector that detects X-ray energy diffracted from the sample; and
a movement assembly that allows movement of one of the source and detector along a predetermined path between a first position, in which the source and detector are on same side of the horizontal axis, and a second position, in which the source and detector are on opposite sides of the horizontal axis from each other. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. An X-ray diffraction apparatus for analyzing a sample positioned at a sample site, the sample being located on a sample holder having a plurality of sample locations, the apparatus comprising:
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a goniometer;
a mounting assembly that maintains the sample holder in a horizontal orientation and that is movable in at least two directions to reposition the sample holder to change which of the plurality of sample locations is at the sample site;
an X-ray source assembly that is connected to a first circle of the goniometer and that has an X-ray source that directs X-ray energy toward the sample holder, the source assembly being movable with movement of the first goniometer circle along a predetermined path to relocate the X-ray source from a first source position in which the X-ray energy is directed toward an upper surface of the sample holder to a second source position in which the X-ray energy is directed toward a lower surface of the sample holder; and
an X-ray detector assembly that is connected to a second goniometer circle of the goniometer and that has an X-ray detector that detects X-ray energy diffracted from an upper surface of the sample, the detector assembly being movable with the second goniometer circle.
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22. An X-ray diffraction apparatus for analyzing a sample on a sample holder, the apparatus comprising:
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a mounting assembly that locates the sample holder at a predetermined location;
an X-ray source that directs X-ray energy toward the sample holder;
an X-ray detector that detects X-ray energy diffracted from the sample; and
a goniometer to which the X-ray source and the X-ray detector are secured, the goniometer having at least two circles that are rotatable independently of each other and that each have a mounting side to which either the X-ray source or the X-ray detector may be secured, each of the circles also being connected to a respective counterweight that is located on a side of that circle opposite its mounting side, the counterweight for a first of the circles being connected to the first circle via a rotary connection aligned with a central axis of the goniometer, and the counterweight for a second of the circles being connected to the second circle via a connecting rod that extends around an outer surface of the goniometer. - View Dependent Claims (23, 24, 25)
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26. A method of analyzing a sample on a sample holder, the method comprising:
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locating the sample holder on a mounting assembly that maintains the sample holder along a horizontal axis, with one side of the sample holder being located to a first side of the axis and an opposite side of the sample holder being located to a second side of the axis;
directing X-ray energy toward the sample holder with an X-ray source;
detecting X-ray energy diffracted from the sample with an X-ray detector; and
moving one of the source and detector along a predetermined path between a first position, in which the source and detector are on the same side of the horizontal axis, and a second position, in which the source and detector are on opposite sides of the horizontal axis from each other. - View Dependent Claims (27, 28, 29, 30)
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Specification