Active tester for vehicle circuit evaluation
First Claim
1. A tester comprising:
- a first set of terminals and a second set of terminals;
a signal source for generating a dynamic signal;
a first set of leads connectable at respective first ends to separated points of a circuit and connectable at respective second ends to the first set of terminals;
a second set of leads connectable at respective first ends to the separated points of the circuit and connectable at respective second ends to the second set of terminals;
a data storage device for storing at least one test parameter; and
a data processor, coupled to the data storage device and the signal source, configured to perform the steps of;
controlling application of the dynamic signal to the separated points of the circuit via the first set of terminals;
obtaining a response signal from the second set of terminals representing a response of the circuit between the separated points to the applied dynamic signal;
determining a dynamic parameter of the circuit between the separated points as a function of the dynamic signal;
accessing the at least one test parameter stored in the data storage device; and
generating a test result related to the characteristics of the circuit between the separated points as a function of the at least one test parameter and the determined dynamic parameter.
1 Assignment
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Accused Products
Abstract
An active tester for vehicle circuit evaluation includes a signal source for generating a dynamic signal, such as an AC current, for injecting to a circuit under test. The tester includes a data storage device for storing at least one test parameter and a data processor for processing data. In operation, the data processor controls to apply the dynamic signal to the separated points of the circuit via the first set of terminals. The response of the circuit under test to the applied dynamic signal is measured. The data processor determines a dynamic parameter of the circuit under test as a function of the dynamic signal and the response. The data process then generates a test result related to the characteristics of the circuit as a function of the at least one test parameter and the determined dynamic parameter. The test result is compared with specification values to determine whether the circuit under test works normally.
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Citations
55 Claims
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1. A tester comprising:
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a first set of terminals and a second set of terminals;
a signal source for generating a dynamic signal;
a first set of leads connectable at respective first ends to separated points of a circuit and connectable at respective second ends to the first set of terminals;
a second set of leads connectable at respective first ends to the separated points of the circuit and connectable at respective second ends to the second set of terminals;
a data storage device for storing at least one test parameter; and
a data processor, coupled to the data storage device and the signal source, configured to perform the steps of;
controlling application of the dynamic signal to the separated points of the circuit via the first set of terminals;
obtaining a response signal from the second set of terminals representing a response of the circuit between the separated points to the applied dynamic signal;
determining a dynamic parameter of the circuit between the separated points as a function of the dynamic signal;
accessing the at least one test parameter stored in the data storage device; and
generating a test result related to the characteristics of the circuit between the separated points as a function of the at least one test parameter and the determined dynamic parameter. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. In a tester including a signal source for generating a dynamic signal, and a data processor configured to apply the dynamic signal to a circuit via separated points of the circuit, and determine a dynamic parameter of the circuit between the separated points as a function of the dynamic signal applied to the circuit, the improvement comprising:
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a data storage device, accessible by the data processor, for storing the determined dynamic parameter and at least one test parameter; and
the data processor configured to perform the steps of;
accessing the at least one test parameter stored in the data storage device;
accessing the determined dynamic parameter stored in the data storage device; and
generating a test result as a function of the at least one test parameter and the determined dynamic parameter. - View Dependent Claims (16)
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17. A method for determining characteristics of a circuit, the method comprising the machine-implemented steps of:
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generating a dynamic signal;
applying the dynamic signal to separated points of the circuit;
determining a response of the circuit between the separated points to the applied dynamic signal;
determining a dynamic parameter of the circuit between the separated points based on the dynamic signal and the determined response;
accessing at least one test parameter; and
generating a test result related to the characteristics of the circuit as a function of the dynamic parameter of the circuit between the separated points and the at least one test parameter. - View Dependent Claims (18, 19, 20)
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21. A method for testing characteristics of a circuit, the method comprising the machine-implemented steps of:
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applying an AC signal to the circuit via separated points of the circuit;
obtaining a response signal representing a response of the circuit between the separated points to the applied AC signal;
calculating the impedance of the circuit between the separated points based on the AC signal and the response signal;
storing the impedance of the circuit between the separated points;
accessing a preset test parameter representing a current; and
calculating a voltage between the separated points of the circuit in response to the current based on the preset test parameter and the impedance. - View Dependent Claims (22, 23, 24)
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25. A tester comprising:
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a first set of signal coupling means and a second set of signal coupling means;
means for generating a dynamic signal;
a first set of connecting means for connecting separated points of a circuit to the first set of signal coupling means;
a second set of connecting means for connecting the separated points of the circuit to the second set of signal coupling means;
data storage means for storing at least one test parameter; and
data processing means, coupled to the data storage means and the means for generating the dynamic signal, for performing the steps of;
controlling application of the dynamic signal to the separated points of the circuit via the first set of signal coupling means;
obtaining a response signal from the second set of signal coupling means representing a response of the circuit between the separated points to the applied dynamic signal;
determining a dynamic parameter of the circuit between the separated points as a function of the dynamic signal;
accessing the at least one test parameter stored in the data storage means; and
generating a test result related to the characteristics of the circuit between the separated points as a function of the at least one test parameter and the determined dynamic parameter. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32, 33)
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34. A tester comprising:
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at least one first terminal and at least one second terminal;
a signal source for generating a dynamic signal;
a data storage device for storing at least one test parameter; and
a data processor, coupled to the data storage device and the signal source, configured to perform the steps of;
controlling application of the dynamic signal to a circuit via the at least one first terminal;
obtaining a response signal from the at least one second terminal representing a response of the circuit to the applied dynamic signal;
determining a dynamic parameter of the circuit as a function of the dynamic signal;
accessing the at least one test parameter stored in the data storage device; and
generating a test result related to the characteristics of the circuit as a function of the at least one test parameter and the determined dynamic parameter. - View Dependent Claims (35, 36, 37, 38)
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39. A tester comprising:
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first means for coupling signals;
means for generating a dynamic signal;
data storage means for storing at least one test parameter; and
data processing means, coupled to the data storage means and the means for generating the dynamic signal, configured to perform the steps of;
controlling application of the dynamic signal to a circuit via the signal coupling means;
obtaining a response signal from the signal coupling means representing a response of the circuit to the applied dynamic signal;
determining a dynamic parameter of the circuit as a function of the dynamic signal;
accessing the at least one test parameter stored in the data storage means; and
generating a test result related to the characteristics of the circuit as a function of the at least one test parameter and the determined dynamic parameter. - View Dependent Claims (40, 41, 42, 43)
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44. A method for testing a circuit comprising the steps of:
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applying the dynamic signal to the circuit;
obtaining a response signal representing a response of the circuit to the applied dynamic signal;
determining a dynamic parameter of the circuit as a function of the dynamic signal;
accessing at least one test parameter; and
generating a test result related to the characteristics of the circuit as a function of the at least one test parameter and the determined dynamic parameter. - View Dependent Claims (45, 46, 47, 48)
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49. In a tester including a signal source for generating a dynamic signal, and a data processor configured to apply the dynamic signal to a circuit, and determine a dynamic parameter of the circuit as a function of the dynamic signal applied to the circuit, the improvement comprising:
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a data storage device, accessible by the data processor, for storing the determined dynamic parameter and at least one test parameter; and
the data processor configured to perform the steps of;
accessing the at least one test parameter stored in the data storage device;
accessing the determined dynamic parameter stored in the data storage device; and
generating a test result as a function of the at least one test parameter and the determined dynamic parameter. - View Dependent Claims (50)
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51. A tester comprising:
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at least one first terminal and at least one second terminal;
a signal source for generating a dynamic signal;
a data storage device for storing specification information; and
a data processor, coupled to the data storage device and the signal source, configured to perform the steps of;
controlling application of the dynamic signal to the circuit via the at least one first terminal;
obtaining a response signal from the at least one second terminal representing a response of the circuit to the applied dynamic signal;
determining a dynamic parameter of the circuit as a function of the dynamic signal;
accessing the specification information stored in the data storage device;
comparing the specification information and the dynamic parameter; and
indicating a connection condition of the circuit based on a result of the comparing step.
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52. A tester comprising:
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a first set of terminals and a second set of terminals;
a signal source for generating a dynamic signal;
a first set of leads connectable at respective first ends to separated points of a circuit and connectable at respective second ends to the first set of terminals;
a second set of leads connectable at respective first ends to the separated points of the circuit and connectable at respective second ends to the second set of terminals;
a data storage device for storing at least one test parameter; and
a data processor, coupled to the data storage device and the signal source, configured to perform the steps of;
controlling application of the dynamic signal to the separated points of the circuit via the first set of terminals;
obtaining a response signal from the second set of terminals representing a response of the circuit between the separated points to the applied dynamic signal;
determining a dynamic parameter of the circuit between the separated points as a function of the dynamic signal;
accessing the at least one test parameter stored in the data storage device; and
generating a test result related to the characteristics of the circuit between the separated points as a function, wherein the test result relates to a connection condition of the circuit.
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53. A method for determining characteristics of a circuit, the method comprising the machine-implemented steps of:
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generating a dynamic signal;
applying the dynamic signal to separated points of the circuit;
determining a response of the circuit between the separated points to the applied dynamic signal;
determining a dynamic parameter of the circuit between the separated points based on the dynamic signal and the determined response;
accessing at least one test parameter; and
generating a test result related to the characteristics of the circuit as a function of the dynamic parameter of the circuit between the separated points and the at least one test parameter, wherein the test result relates to a connection condition of the circuit.
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54. A tester comprising:
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at least one first terminal and at least one second terminal;
a signal source for generating a dynamic signal;
a data storage device for storing at least one test parameter; and
a data processor, coupled to the data storage device and the signal source, configured to perform the steps of;
controlling application of the dynamic signal to a circuit via the at least one first terminal;
obtaining a response signal from the at least one second terminal representing a response of the circuit to the applied dynamic signal;
determining a dynamic parameter of the circuit as a function of the dynamic signal;
accessing the at least one test parameter stored in the data storage device; and
generating a test result related to the characteristics of the circuit as a function of the at least one test parameter and the determined dynamic parameter, wherein the test result relates to a connection condition of the circuit.
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55. A method for testing a circuit comprising the steps of:
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applying the dynamic signal to the circuit;
obtaining a response signal representing a response of the circuit to the applied dynamic signal;
determining a dynamic parameter of the circuit as a function of the dynamic signal;
accessing at least one test parameter; and
generating a test result related to the characteristics of the circuit as a function of the at least one test parameter and the determined dynamic parameter, wherein the test result relates to a connection condition of the circuit.
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Specification