Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
First Claim
1. A method for measuring characteristics of an electrical signal inside of an integrated circuit, the method comprising:
- applying the electrical signal to a signal analysis circuit disposed within the integrated circuit;
wherein the signal analysis circuit changes its condition based on the applied electrical signal;
detecting the change of the condition of the signal analysis circuit; and
determining the characteristics of the electrical signal inside the integrated circuit based on the detected change of the condition of the signal analysis circuit.
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Abstract
Systems and methods consistent with principles of the present invention allow contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits. The invention utilizes a signal analysis circuit, such as a voltage comparator, disposed with the circuit under test, which is optically coupled with the external timing measurement equipment. The signal analysis circuit changes its state depending on the characteristics of the measured electrical signal applied thereto. The changes in the condition of the signal analysis circuit are sensed by the external timing measurement equipment provided outside the circuit under test. To this end, the signal analysis circuit is optically coupled with the external measurement equipment registering specific changes in the condition of the signal analysis circuit. The information on the condition of the signal analysis circuit registered by the external measurement equipment is used to study the characteristics of the dynamic electrical signals within the circuit.
28 Citations
38 Claims
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1. A method for measuring characteristics of an electrical signal inside of an integrated circuit, the method comprising:
- applying the electrical signal to a signal analysis circuit disposed within the integrated circuit;
wherein the signal analysis circuit changes its condition based on the applied electrical signal;
detecting the change of the condition of the signal analysis circuit; and
determining the characteristics of the electrical signal inside the integrated circuit based on the detected change of the condition of the signal analysis circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
- applying the electrical signal to a signal analysis circuit disposed within the integrated circuit;
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17. An apparatus for measuring characteristics of an electrical signal inside of an integrated circuit, the apparatus comprising:
- a signal analysis circuit disposed within the integrated circuit;
wherein the electrical signal inside the integrated circuit causes a change in a condition of the signal analysis circuit; and
a detector for detecting the change in the condition of the signal analysis circuit;
wherein the characteristics of the electrical signal inside the integrated circuit are determined based on the detected condition change. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32)
- a signal analysis circuit disposed within the integrated circuit;
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33. An integrated circuit comprising a signal analysis circuit disposed within the integrated circuit, the signal analysis circuit changing its condition based on an electrical signal applied to the signal analysis circuit;
- wherein the signal analysis circuit comprises a photon emitting structure for transmitting information on the change of the condition of the signal analysis circuit to an external measuring equipment.
- View Dependent Claims (34, 35, 36, 37, 38)
Specification