Optical inspection system for reconstructing three-dimensional images of coins and for sorting coins

• US 20060032726A1
• Filed: 08/10/2004
• Published: 02/16/2006
• Est. Priority Date: 08/10/2004
• Status: Abandoned Application

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Baer, Richard L., Zhang, Xuemei, Vook, Dietrich W., Baharav, Izhak, Rosner, S. Jeffrey
• Application Number:
  US10/915,282
• Publication Number:
  US 20060032726A1
• Time in Patent Office: Days
• US Class Current: 194/328
• CPC Class Codes: G07D 5/005 Testing the surface pattern, e.g. relief

Abstract

A coin inspection system including a coin passageway, an illumination apparatus to illuminate at least one coin positioned on the coin passageway, a sensing apparatus positioned to receive light reflected from the coin and a processing apparatus to reconstruct a three-dimensional image of the coin based on the reflected light.

Claims

1. A coin inspection system, comprising:

a coin passageway;

an illumination apparatus to illuminate at least one coin positioned on the coin passageway;

a sensing apparatus positioned to receive light reflected from the coin; and

a processing apparatus to reconstruct a three-dimensional image of the coin based on the reflected light.

2. The coin inspection system of claim 1, in which the coin passageway comprises:

a conveyer system operable to convey the coin before the illumination apparatus.

3. The coin inspection system of claim 2, in which the conveyer system further comprises:

a grooved slide to hold the coin; and

a releasable stop to position at least one surface of the coin before the illumination apparatus.

4. The coin inspection system of claim 2, in which the coin passageway further comprises a guiding mechanism in proximity to the conveyer system operable to direct the coin into a channel based on the monetary value of the coin.

5. The coin inspection system of claim 1, in which the illumination apparatus comprises:

light-emitting elements disposed in concentric circular arrays around an axis orthogonal to a plane of a surface of the coin, the light-emitting elements producing an illumination gradient across at least a contiguous portion of the light-emitting elements; and

a light control circuit connected to the light-emitting elements to selectively activate the light-emitting elements in pre-established light patterns.

6. The coin inspection system of claim 5, in which the sensing apparatus is operable to obtain images of light reflected from the coin under the illumination gradients while the coin is maintained in a constant spatial relationship with the sensing apparatus.

7. The coin inspection system of claim 5, in which the light emitting elements are one of light emitting diodes, edge-emitting lasers, vertical-cavity-surface-emitting lasers, incandescent light sources with color filters and any combination thereof.

8. The coin inspection system of claim 1, in which the sensing apparatus is one of a camera and a CCD array.

9. The coin inspection system of claim 1, in which the illumination apparatus comprises:

at least one light emitting element;

a light control circuit connected to the light-emitting element to selectively activate the light emitting element; and

a conical element having a gradient of optical transparency across at least a contiguous portion of the conical element, in which the conical element is positioned between the light emitting element and the coin.

10. The coin inspection system of claim 9, in which the conical element has a small opening opposite a large opening, the small opening and large opening are aligned about a conical axis, and the large opening is positioned to transmit light from the light emitting element upon a surface of the coin.

11. The coin inspection system of claim 9, in which the at least one light emitting element comprises light emitting elements arranged in a circular array around the conical axis, the circular array being divided into sections, each of the sections independently illuminating the coin.

12. The coin inspection system of claim 11, in which each of the sections comprises light emitting elements having the same emission wavelength.

13. The coin inspection system of claim 9, in which the sensing apparatus is positioned in proximity to the small opening and is operable to obtain images of light reflected from the coin under two or more respective illumination gradients while the coin is maintained in a constant spatial relationship with the sensing apparatus.

14. The coin inspection system of claim 1, in which the illumination apparatus comprises more than one illumination apparatus.

15. The coin inspection system 11 of claim 1, in which the processing apparatus to determine a monetary value comprises:

a memory to store a database comprising coin images from a particular country.

16. A method for inspecting coins, the method comprising:

receiving a coin on a coin passageway;

illuminating the coin;

sensing reflected light from the coin; and

reconstructing a three-dimensional image based on the reflected light.

17. The method of claim 16, further comprising:

sorting the coin based on the reconstructed three-dimensional image.

18. The method of claim 16, further comprising:

determining a monetary value of the at least one coin based on the reconstructed three-dimensional image.

19. The method of claim 16, further comprising:

storing the reconstructed three-dimensional image in memory.

20. A coin inspection system comprising:

means for receiving a coin on a coin passageway;

means for illuminating the coin;

means for sensing reflected light from the coin; and

means for reconstructing a three-dimensional image based on the reflected light.