Novel folded Mach-Zehnder interferometers and optical sensor arrays

• US 20060034569A1
• Filed: 08/11/2004
• Published: 02/16/2006
• Est. Priority Date: 08/11/2004
• Status: Abandoned Application

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Kapusta, Christopher James, Guida, Renato, Tolliver, Todd Ryan, Dasgupta, Samhita, Shih, Min-Yi
• Application Number:
  US10/917,847
• Publication Number:
  US 20060034569A1
• Time in Patent Office: Days
• US Class Current: 385/39
• CPC Class Codes: G01D 5/35383 using multiple sensor devices using multiplexing techniques
• CPC Class Codes: G02B 6/12007 forming wavelength selective elements, e.g. multiplexer, demultiplexer
• CPC Class Codes: G02B 6/29353 with a wavelength selective element in at least one light guide interferometer arm, e.g. grating, interference filter, resonator
• CPC Class Codes: G02F 1/225 in an optical waveguide structure

Abstract

The invention provides novel “folded” Mach-Zehnder interferometers (“folded” MZI'"'"'s), methods for making folded MZI'"'"'s, and systems and devices incorporating them. The novel folded MZI'"'"'s are elaborated from conventional MZI structures by cutting across the interferometer arms of a conventional MZI structure and creating reflectors on the exposed ends of the interferometer arms to form two “folded” MZI'"'"'s from a single conventional Mach-Zehnder interferometer structure. The novel folded MZI'"'"'s show promise as sensors having a reduced size and enhanced sensitivity relative to sensors incorporating conventional Mach-Zehnder Interferometers.

Claims

1. A folded Mach-Zehnder interferometer comprising:

a) a y-splitter;

b) a pair of interferometer arms and, each of said interferometer arms being terminated by a reflector; and

c) a waveguide adapted to transmit both incoming signals and outgoing signals in opposite directions.

2. A folded Mach-Zehnder interferometer according to claim 1 wherein said reflectors are independently a reflective mirror, Bragg grating, or a combination thereof.

3. A folded Mach-Zehnder interferometer according to claim 1 wherein said reflectors are aluminum mirrors.

4. A folded Mach-Zehnder interferometer according to claim 1 wherein said reflectors are Bragg gratings.

5. A folded Mach-Zehnder interferometer according to claim 1 further comprising at least one sensing electrode.

6. A sensing system comprising a folded Mach-Zehnder interferometer, said system comprising:

a) a light source providing a light input beam, said light source being optically connected to at least one waveguide having a length,

b) at least one sensor optically connected to said waveguide, said sensor comprising two interferometer arms and equipped with means for reflecting light; and

c) at least one detector adapted to receive a light output beam, said detector being optically connected to said waveguide;

wherein said light input beam and said light output beam travel a portion of the length of the waveguide in opposite directions.

7. The sensing system according to claim 6 wherein said sensing system is configured to be connected to at least one of an x-ray imaging system, a baggage inspection system, a spectroscopic sensing system, an antenna, a radio-frequency receiver, a photonics communication system, a radar, a security system, an identification system, a medical diagnostic system, an implant, an archival system, a microelectromechanical device, a mobile communication system, a global positioning system, a navigation system, a portable and wall-pluggable probe, a network configuration sensing system array, an antenna sensor array, or a combination thereof.

8. The sensing system according to claim 6 wherein said light input beam is derived from at least one of an electromagnetic signal, a mechanical pulse, a chemical response, a biological response, or a combination thereof.

9. The sensing system according to claim 6 wherein said light input beam and said light output beam are interfaced with at least one of a directional coupler, a splitter, an optical amplifier, an isolator, a delay line, a time division multiplexing system, a wavelength division multiplexing system, a code division multiplexing system, a polarization multiplexing system, an optical mirror, a Bragg grating, or a combination thereof.

10. The sensing system according to claim 6 wherein said sensing system is patterned on a single wafer.

11. A sensor array comprising:

a) a plurality of folded Mach-Zehnder interferometers.

12. A sensor array according to claim 11, said sensor array further comprising at least one sensing electrode, at least one directional coupler, at least one optical amplifier, at least one delay line, or at least one Bragg grating.

13. A sensor array according to claim 11 comprising at least one sensing electrode.

14. An optical network comprising a sensor array, said sensor array comprising a plurality of folded Mach-Zehnder interferometers.

15. An optical network according to claim 14 wherein said sensor array further comprises at least one sensing electrode, at least one directional coupler, at least one optical amplifier, at least one delay line, or at least one Bragg grating.

16. A method for making a folded Mach-Zehnder interferometer, said method comprising:

a) providing at least one substrate;

b) forming a conventional Mach-Zehnder structure on said substrate, said conventional Mach-Zehnder structure comprising two interferometer arms, and waveguides;

c) cutting said Mach-Zehnder structure to expose surfaces of the interferometer arms; and

d) forming a metallic layer on said exposed surfaces of the interferometer arms to provide a metallized folded Mach-Zehnder structure.

17. The method according to claim 16 wherein said substrate comprises at least one material selected from the group consisting of metals, glass, thermoplatics and thermosets.

18. The method according to claim 16 wherein said substrate is selected from the group consisting of polyetherimdes, polyimides, polyesters, liquid crystalline polymers, polycarbonates, polyacrylates, olefin polymers, or a combination thereof.

19. The method according to claim 16 wherein said Mach-Zehnder structure is formed by at least one of lithography, photolithography, photomasking, photopatterning, micropatterning, sputtering, chemical etching, ion-implantation, or a combination thereof.

20. The method according to claim 16 wherein said formed Mach-Zehnder structure is cut along a predetermined cutting axis using means selected from the group consisting of a diamond saw, a laser beam, and a ion etching device.

21. The method according to claim 16 wherein said metallic layer is formed using at least one of sputtering, evaporation, physical vapor deposition, chemical vapor deposition, or a combination thereof.

22. The method according to claim 16 wherein said metallic layer comprises at least one of gold, silver, nickel, titanium, titanium-tungsten, copper, aluminum, platinum, silica, tantalum, tantalum nitride, chromium, or a combination thereof.

23. The method according to claim 16 wherein said conventional Mach-Zehnder interferometer is patterned on a substrate selected from the group consisting of silicon, glass, ceramic materials, and plastics.

24. The method according to claim 16 wherein said conventional Mach-Zehnder interferometer is patterened on a silicon wafer.