Manufacturing process of thin film transistor liquid crystal display
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Abstract
A process for manufacturing a thin film transistor liquid crystal display (TFT-LCD) is disclosed. The process can reduce the number of the mask used in the photolithography process to three masks, form a capacitor during the manufacturing process simultaneously, and enhance the transmission rate of the TFT-LCD. Because the pixel electrodes are formed directly on the substrate, without forming an insulator layer in the pixel area, the transmission can be enhanced. The manufacturing process also provides a protective circuit for avoiding electrostatic discharge damage, and a passivation layer to protect the capacitor, the gate line, and the signal line.
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Citations
20 Claims
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1-11. -11. (canceled)
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12. A thin film transistor liquid crystal display, comprising:
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a substrate comprising a thin film transistor and a capacitor disposed thereon; and
a signal line comprising;
a signal insulating layer formed on the substrate;
a signal semiconductor layer and a signal doped silicon layer formed on the signal insulating layer;
a signal metal layer formed on the signal doped silicon layer; and
a signal transparent conducting layer formed on the signal metal layer, wherein the signal transparent conducting layer has the same pattern with the signal metal layer in the signal line. - View Dependent Claims (13, 14, 15, 16)
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17. A thin film transistor liquid crystal display, comprising:
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a substrate;
a thin film transistor comprising;
a gate electrode formed on the substrate;
a transistor insulating layer and a transistor semiconductor layer formed on the gate electrode;
a first doped silicon layer and a second doped silicon layer formed on the transistor semiconductor layer, the first doped silicon layer and the second doped silicon layer being separated by a channel area;
a source metal layer and a source transparent conducting layer formed on the first doped silicon layer; and
a drain metal layer and a drain transparent conducting layer formed on the second doped layer;
a capacitor comprising;
a capacitor bottom electrode formed on the substrate;
a capacitor insulating layer and a capacitor semiconductor layer formed on the capacitor bottom electrode;
a capacitor doped silicon layer formed on the capacitor semiconductor layer; and
a capacitor metal layer and a capacitor transparent conducting layer formed on the capacitor doped silicon layer, and the capacitor metal layer being defined as a capacitor upper electrode; and
a signal line comprising;
a signal insulating layer formed on the substrate;
a signal semiconductor layer and a signal doped silicon layer formed on the signal insulating layer;
a signal metal layer formed on the signal doped silicon layer; and
a signal transparent conducting layer formed on the signal metal layer;
wherein a side wall of the source metal layer is substantially aligned to a sidewall of the source transparent conducting layer, the capacitor transparent conducting layer has a first width, the capacitor metal layer has a second width, the capacitor semiconductor layer has a third width, and the first width, the second width, and the third width are substantially the same, and the signal transparent conducting layer has the same pattern with the signal metal layer in the signal line. - View Dependent Claims (18, 19, 20)
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Specification