Non-destructive infrared inspection device

• US 20060043303A1
• Filed: 10/26/2005
• Published: 03/02/2006
• Est. Priority Date: 07/16/2003
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Georgeson, Gary E., Safai, Morteza
• Granted Patent: US 7,312,454 B2
• Time in Patent Office: Days
• US Class Current: 250/347
• CPC Class Codes: G01N 21/9515 Objects of complex shape, e.g. examined with use of a surface follower device measuring contours and curvatures G01B11/24
• CPC Class Codes: G01N 21/954 Inspecting the inner surface of hollow bodies, e.g. bores

Abstract

There is provided a non-destructive inspection device having an infrared sensor for infrared thermography inspection of a structure or surface. A rotatable reflector reflects infrared light from an inspected surface to an infrared sensor. An inspecting portion of a non-destructive device is magnetically coupled to an actuating portion of the device for concerted movement of the portions. An inspection device includes both an infrared sensor for infrared imaging and an optical device such as a camera for visible light imaging.

Claims

1. A non-destructive inspection device for inspecting a structure, the inspection device comprising:

an actuating portion comprising at least one magnet, wherein the actuating portion is structured for placement on a first surface of the structure such that the actuating portion is movable relative to the structure; and

an inspecting portion comprising an infrared sensor and at least one magnet, wherein the inspecting portion is structured for positioning on a surface of the structure opposite the first surface such that the inspecting portion is magnetically coupled to the actuating portion so that movement of the actuating portion causes the inspecting portion to move in concert with the actuating portion without the inspecting portion directly contacting the actuating portion.

2. A non-destructive inspection device according to claim 1 wherein the inspecting portion further comprises a camera.

3. A non-destructive inspection device according to claim 2 wherein the inspecting portion comprises an optical borescope.

4. A non-destructive inspection device according to claim 1 wherein the inspecting portion comprises a laser.

5. A non-destructive inspection device according to claim 1 wherein said inspecting portion further comprises a rotatable reflector disposed to receive infrared light from the structure and to reflect the infrared light toward the infrared sensor.

6. A method of inspecting a structure, comprising the steps of:

placing an actuating portion of a non-destructive inspection device on a first surface of the structure, wherein the actuating portion comprises at least one magnet;

positioning an inspecting portion of the non-destructive inspection device on a surface of the structure opposite the first surface, wherein the inspecting portion comprises an infrared sensor and at least one magnet such that positioning the inspecting portion comprises magnetically coupling the magnet of the actuating portion to the magnet of the inspecting portion;

moving the actuating portion on the first surface of the structure such that the inspecting portion is moved in concert with actuating portion; and

receiving an output from the infrared sensor.

7. A method according to claim 6, wherein the inspecting portion comprises a camera, and wherein the method further comprises the step of monitoring an output from the camera.

8. A method according to claim 6, further comprising rotating a reflector and reflecting infrared light from a surface of the structure to the infrared sensor by way of the reflector.

9. An infrared inspection system comprising:

an infrared sensor;

a first rotatable reflector disposed to reflect infrared light from an inspected surface to the infrared sensor; and

a display system communicably coupled to the infrared sensor for presenting data related to an output signal of the infrared sensor.

10. An infrared inspection system according to claim 9, further comprising a motor operatively coupled to the first rotatable reflector for rotating the reflector.

11. An infrared inspection system according to claim 9, wherein the first rotatable reflector comprises a surface that is oriented approximately forty five degrees from an axis about which the first rotatable reflector is rotatable.

12. An infrared inspection system according to claim 9, wherein the infrared sensor is disposed on an axis about which the first rotatable reflector is rotatable.

13. An infrared inspection system according to claim 9, further comprising an infrared lens having a focal plane coincident with the infrared sensor.

14. An infrared inspection system according to claim 13, wherein an optical pathway is defined by at least the lens, the first rotatable reflector, and the infrared sensor, and wherein the first rotatable reflector is disposed in the optical pathway between the lens and the infrared sensor.

15. An infrared inspection system according to claim 9, wherein said infrared sensor comprises an infrared sensitive array.

16. An infrared inspection system according to claim 15, further comprising an infrared lens disposed to focus an infrared image of an inspected surface onto the infrared sensor, wherein the display system is communicably coupled to the infrared sensor for presenting a graphical representation of the infrared image.

17. An infrared inspection system according to claim 9, further comprising an optical device that is sensitive to visible light and is disposed to collect visible light from an inspected surface.

18. An infrared inspection system according to claim 17, further comprising a second rotatable reflector disposed to reflect visible light from an inspected surface to the optical device.

19. An infrared inspection system according to claim 9, further comprising a second rotatable reflector and a camera device that is disposed to collect images of an inspected surface by way of the second rotatable reflector.

20. An infrared inspection system according to claim 19, wherein the infrared sensor is disposed to capture an infrared image of an inspected surface, wherein the camera device is disposed to capture a visible-light image of the inspected surface, and wherein the display system is communicably coupled to the infrared sensor and to the camera device for presenting graphical representations of the infrared image and the visible-light image.

21. An infrared inspection system according to claim 9, further comprising one or more carriage elements by which at least the infrared sensor and the first rotatable reflector are mobile.

22. An infrared inspection system according to claim 21, further comprising a coupling capable of applying motive force at least to the infrared sensor and the first rotatable reflector for causing movement thereof.

23. An infrared inspection system according to claim 21, wherein the infrared sensor and the first rotatable reflector are mobile relative to the display system.

24. An infrared inspection system according to claim 21, further comprising:

a motor operatively coupled at least to the one or more carriage elements for causing movement of at least the infrared sensor and the first rotatable reflector; and

a controller operatively coupled to the motor for controlling movement of at least the infrared sensor and the first rotatable reflector relative to the controller and display system.

25. An infrared inspection system according to claim 9, further comprising:

a second rotatable reflector;

a camera device disposed to collect visible-light images of an inspected surface by way of the second rotatable reflector; and

a mobile carriage upon which are disposed the infrared sensor, the first rotatable reflector, the second rotatable reflector, and the camera device;

wherein the display system is communicably coupled to the infrared sensor for presenting graphical representations of infrared images of an inspected surface,

wherein the display system is communicably coupled to the camera device for presenting graphical representations of the visible-light images, and

wherein the mobile carriage is movable relative to the display system.