MEMORY STACKING SYSTEM AND METHOD

• US 20060044860A1
• Filed: 09/01/2004
• Published: 03/02/2006
• Est. Priority Date: 09/01/2004
• Status: Active Grant

• Current Assignee: Round Rock Research LLC
• Original Assignee: Micron Technology, Inc.
• Inventors: Kinsley, Thomas H., Kilbuck, Kevin M.
• Granted Patent: US 7,046,538 B2
• Time in Patent Office: Days
• US Class Current: 365/52
• CPC Class Codes: G11C 5/02 Disposition of storage elements, e.g. in the form of a matrix array
• CPC Class Codes: G11C 5/04 Supports for storage elements , e.g. memory modules; Mounting or fixing of storage elements on such supports
• CPC Class Codes: G11C 8/12 Group selection circuits, e.g. for memory block selection, chip selection, array selection

Abstract

A method of forming a stacked memory module from a plurality of memory devices is provided. Each of the plurality of memory devices is modified to include a logic block for decoding a plurality of chip select signals. A first high density memory module is also provided that includes the modified memory devices and a serial presence detect device. The first high density memory module is included within an electronic system. Also, an additional method of forming a stacked memory module is provided, the method requiring modification of an address buffer to include a logic block for decoding a plurality of chip select signals. A second high density memory module is also provided that includes the modified address buffer and a serial presence detect device. The second high density memory module is included within an electronic system.

Claims

1. A method of forming a stacked memory module, comprising:

providing a plurality of memory devices to include a logic block for decoding a plurality of chip select signals;

stacking the plurality of memory devices;

interconnecting a plurality of pins between the plurality of memory devices, including a chip select pin and a first unused pin of each of the plurality of memory devices; and

updating a serial presence detect device to indicate the stacked memory module includes the plurality of memory devices and each of the plurality of chip select signals is transmitted to a corresponding one of a plurality of designated pins on the plurality of memory devices.

2. The method of claim 1, further comprising one of fuse blowing the logic block in the plurality of memory devices and externally configuring the logic block.

3. The method of claim 1, further comprising configuring a look-up table to interpret each of the plurality of chip select signals of the plurality of memory devices.

4. The method of claim 1, wherein providing includes designating selected pins to receive the plurality of chip select signals, the designated pins comprising the chip select pin to which a first one of the plurality of chip select signals is coupled and the first unused pin to which a second one of the plurality of chip select signals is coupled.

5. The method of claim 4, further comprising designating the first unused pin, the first unused pin comprising a no-connect pin or an unused address pin.

6. The method of claim 1, wherein providing includes programming the logic block to result in activation of one of the plurality of memory devices if the plurality of chip select signals forms a unique binary combination that corresponds to the logic block of one of the plurality of memory devices.

7. The method of claim 1, wherein updating includes creating a look-up table to define combinations of the plurality of chip select signals used by a memory controller to communicate with the plurality of memory devices.

8. The method of claim 1, wherein stacking of the plurality of memory devices includes interconnecting a plurality of dual inline memory modules (“

DIMMs”

), each DIMM comprising a plurality of dynamic random access memory devices.

9. The method of claim 1, wherein stacking of the plurality of memory devices includes interconnecting a second unused pin of each of the plurality of memory devices.

10. The method of claim 9, wherein providing includes designating pins to receive the plurality of chip select signals, the pins comprising the chip select pin to which a first one of the plurality of chip select signals is coupled, the first unused pin to which a second one of the plurality of chip select signals is coupled, and the second unused pin to which a third one of the plurality of chip select signals is coupled.

11. A high density memory module, comprising:

a plurality of memory devices, each comprising logic to decode a binary combination of a plurality of chip select signals received on a plurality of designated pins; and

a serial presence detect device configured to indicate to a memory controller a number of chip select signals to be sent to the plurality of memory devices, and configured to encode the plurality of chip select signals.

12. The high density memory module of claim 11, wherein the logic is a logic block fuse blown into each of the plurality of memory devices.

13. The high density memory module of claim 11, wherein the logic includes a look-up table configured to interpret the binary combination of the plurality of chip select signals.

14. The high density memory module of claim 11, wherein the plurality of designated pins includes a chip select pin and a first unused pin, the first unused pin comprising a no-connect pin or an unused address pin.

15. The high density memory module of claim 11, wherein the plurality of designated pins includes a chip select pin, a first unused pin and a second unused pin, the first and second unused pins including at least one of a no-connect pin and an unused address pin.

16. An electronic system, comprising:

an input device;

an output device;

a memory system, comprising a memory controller; and

a processor device coupled to the input device, the output device and the memory system, at least one of the input device, the output device, the memory system and the processor device including a high density memory module comprising;

a plurality of memory devices, each comprising logic to decode a binary combination of a plurality of chip select signals received on a plurality of designated pins; and

a serial presence detect device configured to indicate to a memory controller a number of chip select signals to be sent to the plurality of memory devices, and configured to encode the plurality of chip select signals.

17. The electronic system of claim 16, wherein the logic is a logic block fuse blown into each of the plurality of memory devices.

18. The electronic system of claim 16, wherein the logic includes a look-up table configured to interpret the binary combination of the plurality of chip select signals.

19. The electronic system of claim 16, wherein the plurality of designated pins includes at least one of a chip select pin and a first unused pin, the first unused pin comprising a no-connect pin or an unused address pin.

20. The electronic system of claim 16, wherein the plurality of designated pins includes a chip select pin, a first unused pin and a second unused pin, the first and second unused pins comprising a no-connect pin and an unused address pin.

21. A method of forming a stacked memory module, comprising:

configuring an address buffer to include a logic block for decoding a plurality of chip select signals, the address buffer further connected to a plurality of memory devices;

stacking the plurality of memory devices to interconnect a plurality of pins, wherein a chip select pin of each of the plurality of memory devices is exclusively connected to the address buffer; and

updating a serial presence detect device to indicate that the stacked memory module includes the plurality of memory devices and that each of the plurality of chip select signals is transmitted to the address buffer.

22. The method of claim 21, wherein configuring includes fuse blowing the logic block in the address buffer.

23. The method of claim 21, wherein configuring includes configuring a look-up table to interpret the plurality of chip select signals.

24. The method of claim 21, wherein configuring includes programming the logic block to result in transmission of one of the plurality of chip select signals to a corresponding one of the plurality of memory devices if the plurality of chip select signals forms a unique binary combination that corresponds to the logic block in the address buffer for one of the plurality of memory devices.

25. The method of claim 21, wherein updating involves creating a look-up table to define combinations of the plurality of chip select signals used by a memory controller to communicate with the plurality of memory devices.

26. The method of claim 21, wherein stacking of the plurality of memory devices includes interconnecting a plurality of dual inline memory modules (“

DIMMs”

), each DIMM comprising a plurality of dynamic random access memory devices.

27. A high density memory module comprising:

a plurality of memory devices, each comprising a chip select pin;

an address buffer, comprising a logic block to decode a binary combination of chip select signals; and

a serial presence detect device capable of indicating to a memory controller a number of chip select signals to be sent to the plurality of memory devices, a manner of encoding the chip select signals, and a designation of traces on which the chip select signals are to be sent.

28. The high density memory module of claim 27, wherein the logic block is fuse blown into the address buffer.

29. The high density memory module of claim 27, wherein the logic block includes a look-up table configured to interpret the binary combination of chip select signals.

30. An electronic system, comprising:

an input device;

an output device;

a memory system, comprising a memory controller; and

a processor device coupled to the input device, the output device and the memory system, at least one of the input device, the output device, the memory system and the processor device including a high density memory module comprising;

a plurality of memory devices, each comprising a chip select pin;

an address buffer, comprising a logic block to decode a binary combination of chip select signals; and

a serial presence detect device configured to indicate to a memory controller a number of chip select signals to be sent to the plurality of memory devices, and configured to encode the chip select signals.

31. The electronic system of claim 30, wherein the logic block is fuse blown into the address buffer.

32. The electronic system of claim 30, wherein the logic block includes a look-up table configured to interpret the binary combination of chip select signals.