Charged-particle beam apparatus and method for automatically correcting astigmatism and for height detection

• US 20060060781A1
• Filed: 04/26/2005
• Published: 03/23/2006
• Est. Priority Date: 08/11/1997
• Status: Abandoned Application

• Current Assignee: Koichi Hayakawa, Masahiro Watanabe, Masayoshi Takeda, Yasuhiro Gunji
• Original Assignee: Koichi Hayakawa, Masahiro Watanabe, Masayoshi Takeda, Yasuhiro Gunji
• Inventors: Watanabe, Masahiro, Gunji, Yasuhiro, Hayakawa, Koichi, Takeda, Masayoshi
• Application Number:
  US11/114,203
• Publication Number:
  US 20060060781A1
• Time in Patent Office: Days
• US Class Current: 250/310
• CPC Class Codes: B82Y 10/00 Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
• CPC Class Codes: B82Y 40/00 Manufacture or treatment of nanostructures
• CPC Class Codes: H01J 2237/15 Means for deflecting or directing discharge
• CPC Class Codes: H01J 2237/1532 Astigmatism
• CPC Class Codes: H01J 2237/216 Automatic focusing methods
• CPC Class Codes: H01J 2237/2482 Optical means
• CPC Class Codes: H01J 2237/31793 Problems associated with lithography
• CPC Class Codes: H01J 2237/31798 detecting pattern defects
• CPC Class Codes: H01J 37/153 Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
• CPC Class Codes: H01J 37/265 Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination
• CPC Class Codes: H01J 37/28 with scanning beams H01J37/268, H01J37/292, H01J37/2955 take precedence
• CPC Class Codes: H01J 37/3174 Particle-beam lithography, e.g. electron beam lithography

Abstract

Charged-particle beam arrangements (e.g., apparatus and methods) for automatically correcting astigmatism and for height detection.

Claims

1. A charged-particle beam apparatus comprising:

a stage on which a sample is set;

a charged-particle optical system for converging a charged-particle beam generated by a charged-particle source;

a scanning means for scanning an area on said sample in which a pattern is formed with said charged-particle beam converged by said charged-particle optical system;

a focus control means for controlling a focal position of said charged-particle beam converged by said charged-particle optical system;

an astigmatism adjustment means for adjusting astigmatism of said charged-particle beam converged by said charged-particle optical system;

an image detection means for obtaining an image of said sample by detecting secondary particles generated from said sample by the scanning of said converged charged-particle beam by said scanning means;

an image-processing means for processing said image obtained by said image detection means; and

a control system for adjusting and controlling said astigmatism of said converged charged-particle beam by using information from said image-processing means,

wherein, said control system so controls that said scanning means scans said charged particle bean in one direction, said image detection means obtains plural images of said sample having mutually different focal positions by changing focal position of said charged particle beam with said focus control means, said image processing means computes sharpness values of said charged-particle optical system in two directions which are substantially perpendicular with each other, said scanning means changes scanning direction in another direction inclined to said one direction and scanning said area on said sample in a direction inclined to that of the previous scanning of said area, said image detection means obtains plural images of said sample having mutually different focal positions by changing focal position of said charged particle beam with said focus control means, said image processing means computes sharpness values of said charged-particle optical system in two directions which are substantially perpendicular with each other, calculating astigmatism of said charged-particle optical system based on said computed sharpness value in four directions of said converged charged-particle beam and feeding back an astigmatism correction amount to said astigmatism adjustment means based on said calculated astigmatism.

2. A charged-particle beam apparatus according to claim 1 wherein said particle-picture detection means carries out a focus scanning operation to obtain said image having a plurality of focal positions two times.

3. A charged-particle beam apparatus according to claim 1 wherein said image-processing means computes a focal offset based on said image having a plurality of focal positions.

4. A charged-particle beam apparatus according to claim 3 wherein said control system feed backs a focus correction quantity based on said converged charged-particle beam'"'"'s focal offset computed by said image-processing means to said focus control means in order to adjust and control said converged charged-particle beam.

5. A charged-particle beam apparatus according to claim 1 wherein said control system carries out non-linear processing to find said astigmatism correction amount based on said converged charged-particle beam'"'"'s sharpness values computed by said image processing means.

6. A charged-particle beam apparatus according to claim 1 wherein said image detection means carries out a focus scanning operation to obtain said image having a plurality of focal positions two times by changing a picture direction by about 45 degrees, about 135 degrees, about −

45 degrees or about −

135 degrees.

7. A charged-particle beam apparatus according to claim 6 wherein said image-processing means:

finds sharpness in substantially a 45-degree direction and sharpness in substantially a 135-degree direction of two types of images from each of said images with different scanning angles and each with a plurality of focal positions, which pictures are obtained from said particle-picture detection means;

finds pieces of directional-sharpness data for said focal positions in four directions, namely, substantially a 0-degree direction, a 45-degree direction, a 90-degree direction and a 135-degree direction, from collected results of a focus scan operation carried out two times;

finds in-focus positions in at least said four found pieces of directional-sharpness data; and

computes an astigmatic difference of said converged charged-particle beam from a relation among said in-focus positions for said four directions.

8. A charged-particle beam apparatus according to claim 1 wherein said image detection means carries out a focus scan operation to obtain an image having a plurality of focus positions two times whereas said image-processing means:

finds pieces of directional-sharpness data in four directions, namely, substantially a 0-degree direction, a 45-degree direction, a 90-degree direction and a 135-degree direction, from focal positions corresponding to said first and second focus scan operations and covariance values of differential pictures in differentiation directions or square roots of said covariance values for said differential pictures in said four directions, namely, said 0-degree direction, said 45-degree direction, said 90-degree direction and said 135-degree direction, of images from said images, which each have a plurality of focal positions and are obtained from said particle-picture detection means;

finds in-focus positions in at least said found pieces of directional sharpness data in said four directions; and

computes an astigmatic difference and a focal offset of said converged charged-particle beam from a relation among said in-focus positions for said four directions.

9. A charged-particle beam apparatus according to claim 1 wherein said sample has a pattern created thereon to include edge elements in at least three directions.

10. A charged-particle beam apparatus according to claim 1 wherein said sample has at least three areas each including a sub-pattern having an edge element so that said sample has a pattern created thereon to include edge elements in at least three directions.

11. A charged-particle beam apparatus according to claim 1 wherein said image detection means controls said focus control means to detect a particle picture having a plurality of focal positions from said sample.

12. A charged-particle beam apparatus according to claim 1 wherein said image detection means detects a particle picture having a plurality of focal positions from a plurality of areas different from each other on said sample.

13. A charged-particle beam apparatus according to claim 1 wherein said sample is an inclined sample or a sample having a staircase-shaped surface.

14. A charged-particle beam apparatus according to claim 1 wherein, while said focus control mean is changing a focal position for said sample at a high speed, said scanning means radiates said converged charged-particle beam to said sample in a scanning operation.

15. A charged-particle beam apparatus according to claim 1, comprising a defect-inspection image-processing means,

wherein said defect-inspection image-processing means inspects said sample for a defect existing on said sample by using an image of said sample;

said image of said sample is obtained by said image detection means as a result of detection of particles, which are generated from said sample when said scanning means radiates said converged charged-particle beam to said sample in a scanning operation; and

said converged charged-particle beam has been subjected to adjustment and control of at least astigmatism thereof in said control system.

16. A charged-particle beam apparatus according to claim 1, comprising:

a defect-inspection image-processing means,

wherein said defect-inspection image-processing means measures dimensions of a pattern existing on an object substrate serving as said sample by using an image of said sample;

said image of said sample is obtained by said image detection means as a result of detection of particles, which are generated from said object substrate when said scanning means radiates said converged charged-particle beam to said sample in a scanning operation; and

said converged charged-particle beam has been subjected to adjustment and control of at least astigmatism thereof in said control system.

26. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 1, comprising inspecting an object substrate serving as said sample for a defect existing on said sample by using said image obtained as a result of detection of particles generated from said sample by radiation of said converged charged-particle beam to said sample in a scanning operation whereby said converged charged-particle beam has been subjected to adjustment and control of said astigmatism.

17. A charged-particle beam apparatus comprising:

a stage on which a sample is set;

a charged-particle optical system for converging a charged-particle beam generated by a charged-particle source;

a scanning means for scanning an area on said sample in which a pattern is formed with said charged-particle beam converged by said charged-particle optical system;

a focus control means for controlling a focal position of said charged-particle beam converged by said charged-particle optical system;

an astigmatism adjustment means for adjusting astigmatism of said charged-particle beam converged by said charged-particle optical system;

an image detection means for obtaining an image of said sample by detecting secondary particles generated from said sample by the scanning of said converged charged-particle beam by said scanning means;

an image-processing means for processing said image obtained by said image detection means;

a control system for adjusting and controlling said astigmatism of said converged charged-particle beam by using information from said image-processing means; and

a height detection means for optically detecting a height on an object substrate serving as said sample,

wherein said control system so controls that said scanning means scans said charged particle bean in one direction, said image detection means obtains plural images of said sample having mutually different focal positions by changing focal position of said charged particle beam with said focus control means, said image processing means computes sharpness values of said charged-particle optical system in two directions which are substantially perpendicular with each other, said scanning means changes scanning direction in another direction inclined to said one direction and scanning said area on said sample in a direction inclined to that of the previous scanning of said area, said image detection means obtains plural images of said sample having mutually different focal positions by changing focal position of said charged particle beam with said focus control means, said image processing means computes sharpness values of said charged-particle optical system in two directions which are substantially perpendicular with each other, calculating astigmatism of said charged-particle optical system based on said computed sharpness value in four directions of said converged charged-particle beam and feeding back an astigmatism correction amount to said astigmatism adjustment means based on said calculated astigmatism, and

wherein said focus control means is controlled on the basis of said optically detected height on said object substrate.

18. A method for adjusting astigmatism of a charged-particle beam apparatus, comprising:

converging a charged-particle beam, which is generated by a charged-particle source, by using a charged-particle optical system;

irradiating and scanning in one direction said converged charged-particle beam in an area on a sample, on which a pattern is formed, to obtain an image of said sample by detecting secondary particles generated from said sample by said irradiating and scanning said converged charged-particle beam;

changing a focal position of said converged charged-particle beam;

obtaining a plurality of images of said sample having mutually different focal positions by repeating the operations from converging to changing for plural times;

repeating the operations from converging to obtaining once more by changing said scanning direction of said converged charged-particle beam to be inclined to said one direction at the irradiating and scanning operations, thereby scanning said area on said sample in a direction inclined to that of the previous scanning of said area;

computing an astigmatism of said charged-particle optical system by calculating sharpness values in two directions substantially perpendicular with each other from the plurality of images obtained at said obtaining operation by scanning said converged charged-particle beam in said one direction and sharpness values in another two directions substantially perpendicular with each other from the plurality of images obtained at said obtaining operation by scanning said converged charged-particle beam in another direction inclined to said one direction and estimating an astigmatism correction amount from said calculated sharpness value in four directions; and

controlling and adjusting said astigmatism of said charged-particle optical system by feeding back said astigmatism correction amount based on said computed astigmatism.

19. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 18, wherein an operation to obtain said images having focal positions different from each other by changing a focal position of said converged charged-particle beam is carried out two times.

20. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 18, wherein, at said computing said sharpness values, a focal offset of said converged charged-particle beam is calculated.

21. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 20, comprising adjusting and controlling a focus of said converged charged-particle beam by feeding back a focus correction quantity based on said calculated focal offset of said converged charged-particle beam to a focus control means.

22. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 18, wherein said computing of said sharpness values includes:

finding degrees of directional sharpness in at least three directions from said images having a plurality of focal positions for said focal positions;

finding in-focus positions at said found degrees of directional sharpness in at least said three directions; and

computing an astigmatic difference of said converged charged-particle beam from a relation among said found in-focus positions for at least said three directions.

23. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 22, wherein at said computing an astigmatic difference, said in-focus positions at said degrees of directional sharpness in at least said three directions are each found by:

finding a maximum value or a peak value for each of said degrees of directional sharpness; and

finding a true position by interpolation based on values in close proximity to said maximum value or said peak value.

24. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 18, wherein, at said obtaining said images, a focus scanning operation to obtain said images are carried out 2 times by changing a picture direction by about 45 degrees, about 135 degrees, about −

45 degrees or about −

135 degrees.

25. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 24, wherein said computing of said sharpness values of said converged charged-particle beam includes:

finding sharpness in a substantially 45-degree direction and sharpness in a substantially 135-degree direction of two types of images from each of said 2-dimensional particle pictures with different scanning angles and each with a plurality of focal positions, which pictures are obtained at said obtaining said image;

finding pieces of directional-sharpness data for said focal positions in four directions, namely, substantially a 0-degree direction, a 45-degree direction, a 90-degree direction and a 135-degree direction, from collected results of a focus scan operation carried out two times;

finding in-focus positions in at least said found pieces of directional sharpness data in said four directions; and

computing an astigmatic difference and a focal offset of said converged charged-particle beam from a relation among said in-focus positions for said four directions.

27. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 18, comprising measuring dimensions of a pattern existing on an object substrate serving as said sample by using said image obtained as a result of detection of particles generated from said sample by radiation of said converged charged-particle beam to said sample in a scanning operation whereby said converged charged-particle beam has been subjected to adjustment and control of said astigmatism.

28. A method for adjusting astigmatism of a charged-particle beam apparatus, said method comprising:

converging a charged-particle beam, which is generated by a charged-particle source, by using a charged-particle optical system;

irradiating and scanning in one direction said converged charged-particle beam in an area of a sample, on which a pattern is formed, to obtain an image of said sample by detecting secondary particles generated from said sample by said irradiating and scanning said converged charged-particle beam;

changing a focal position of said converged charged-particle beam;

obtaining a plurality of images of said sample having mutually different focal positions by repeating the operations from converging to changing for plural times;

repeating the operations from converging to obtaining once more by changing said scanning direction of said converged charged-particle bean to be inclined to said one direction at the irradiating and scanning operations, thereby scanning said area on said sample in a direction inclined to that of the previous scanning of said area;

computing an astigmatism of said charged-particle optical system by calculating sharpness values in two directions substantially perpendicular with each other from the plurality of images obtained at said obtaining operation by scanning said converged charged-particle beam in said one direction and sharpness values in another two directions substantially perpendicular with each other from the plurality of images obtained at said obtaining operation by scanning said converged charged-particle beam in another direction inclined to said one direction, and estimating an astigmatism correction amount from said calculated sharpness value in four directions;

controlling and adjusting said astigmatism of said charged-particle optical system by feeding back said estimated astigmatism correction amount to an astigmatism adjustment means; and

repeating the above operations from converging to controlling until said astigmatism correction amount becomes smaller than a predetermined value.

29. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 28, wherein, at said obtaining a plurality of images, an operation to obtain said image having focal positions different from each other by sequentially changing a focal position of said converged charged-particle beam is carried out two times.

30. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 28, comprising computing a focal offset by using information contained in said images having focal positions different from each other.

31. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 30, comprising adjusting and controlling a focus of said converged charged-particle beam on the basis of a defect calculated at said computing a focal offset.

33. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 28, comprising inspecting an object substrate serving as said sample for a defect existing on said sample by using said image obtained as a result of detection of particles generated from said sample by radiation of said converged charged-particle beam to said sample in a scanning operation whereby said converged charged-particle beam has been subjected to adjustment and control of said astigmatism.

34. A method for automatically adjusting astigmatism of a charged-particle beam apparatus according to claim 28, comprising measuring dimensions of a pattern existing on an object substrate serving as said sample by using said image obtained, as a result of detection of particles generated from said sample by radiation of said converged charged-particle beam to said sample in a scanning operation whereby said converged charged-particle beam has been subjected to adjustment and control of said astigmatism.

32. A method for automatically adjusting astigmatism of a charged-particle beam apparatus, said method comprising:

converging a charged-particle beam, which is generated by a charged-particle source, by using a charged-particle optical system;

irradiating and scanning in one direction said converged charged-particle beam in an area of a sample, on which a pattern is formed, to obtain an image of said sample by detecting secondary particles generated from said sample by said irradiating and scanning said converged charged-particle beam;

changing a focal position of said converged charged-particle beam;

obtaining a plurality of images of said sample having mutually different focal positions by repeating the operations from converging to changing for plural times;

repeating the operations from converging to obtaining once more by changing said scanning direction of said converged charged-particle bean to be inclined to said one direction at the irradiating and scanning operations, thereby scanning said area on said sample in a direction inclined to that of the previous scanning of said area;

computing an astigmatism of said charged-particle optical system by calculating sharpness values in two directions substantially perpendicular with each other from the plurality of images obtained at said obtaining operation by scanning said converged charged-particle beam in said one direction and sharpness values in another two directions substantially perpendicular with each other from the plurality of images obtained at said obtaining operation by scanning said converged charged-particle beam in another direction inclined to said one direction, and estimating an astigmatism correction amount from said calculated sharpness value in four directions; and

controlling and adjusting said astigmatism of said charged-particle optical system by feeding back said estimated astigmatism correction amount to an astigmatism adjustment means;

optically detecting a height of an object substrate serving as said sample;

controlling a focus of said converged charged-particle beam on the basis of information on said detected height of said object substrate; and

repeating the above operations from converging to controlling until said astigmatism correction amount becomes smaller than a predetermined value.