Non-contact tester for electronic circuits
First Claim
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1. A tester for electronic circuits, comprising in combination:
- an electronic circuit which includes a plurality of wireless i/o cells and means for sending and receiving signals via each of the wireless i/o cells, a wireless i/o cell being provided for each contact point on the electronic circuit to be tested;
an independent scanning head having a plurality of wireless i/o cells compatible with the [at least one] wireless i/o cells on the electronic circuit, such that data may be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit, the number of wireless i/o cells on the independent scanning head corresponding in a one to one relationship with the number of wireless i/o cells on the electronic circuit being tested;
the scanning head having a contact probe for power input to energize the electronic circuit.
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Abstract
A non-contact tester for electronic circuits consists of an electronic circuit and independent scanning head, in combination. The electronic circuit includes a micro-fabricated wireless i/o cell and means for sending and receiving signals via the wireless i/o cell. The independent scanning head has a wireless i/o cell that is compatible with the wireless i/o cell on the electronic circuit. This enables data to be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit.
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Citations
6 Claims
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1. A tester for electronic circuits, comprising in combination:
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an electronic circuit which includes a plurality of wireless i/o cells and means for sending and receiving signals via each of the wireless i/o cells, a wireless i/o cell being provided for each contact point on the electronic circuit to be tested;
an independent scanning head having a plurality of wireless i/o cells compatible with the [at least one] wireless i/o cells on the electronic circuit, such that data may be exchanged with the electronic circuit to confirm proper functioning of the electronic circuit, the number of wireless i/o cells on the independent scanning head corresponding in a one to one relationship with the number of wireless i/o cells on the electronic circuit being tested;
the scanning head having a contact probe for power input to energize the electronic circuit. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification