Thermometry probe calibration method
5 Assignments
0 Petitions
Accused Products
Abstract
A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.
66 Citations
11 Claims
-
1. (canceled)
-
2. (canceled)
-
3. (canceled)
-
4. (canceled)
-
5. (canceled)
-
6. (canceled)
-
7. A method for calibrating a temperature probe for a thermometry apparatus, said method comprising the steps of:
-
characterizing the transient heat rise behavior of a temperature probe used with said apparatus;
comparing the characterized transient heat behavior of a said temperature probe to that of a nominal temperature probe and normalizing said characterized transient heat rise behavior based on said comparing step;
storing the normalized transient heat rise behavior on an EEPROM associated with said probe; and
applying the stored normalized transient heat rise behavior to an algorithm for predicting temperature for said probe. - View Dependent Claims (8)
-
-
9. A method for calibrating a temperature probe for a thermometry apparatus, said method comprising the steps of:
-
forcing the probe to an initial temperature value;
placing the probe in a test fixture that promotes temperature rise of said probe from said initial temperature value at a known rate;
plotting the temperature rise of said probe versus time;
determining coefficients of said probe from said plotted temperature rise versus time data for storing on a EEPROM of said thermometry apparatus; and
applying said coefficients to an algorithm for predicting temperature. - View Dependent Claims (10, 11)
-
Specification