Electrical test device having isolation slot

• US 20060087333A1
• Filed: 09/23/2005
• Published: 04/27/2006
• Est. Priority Date: 10/22/2004
• Status: Active Grant

• Current Assignee: Advanced Semiconductor Engineering Inc (ASE Technology Holding Co., Ltd.)
• Original Assignee: Advanced Semiconductor Engineering Inc (ASE Technology Holding Co., Ltd.)
• Inventors: Tsai, Chih-Wei, Li, Pao-Nan
• Granted Patent: US 7,235,989 B2
• Time in Patent Office: Days
• US Class Current: 324/756.40
• CPC Class Codes: G01R 1/06772 High frequency probes

Abstract

The invention relates to an electrical test device having isolation slot. The electrical test device comprises a substrate and a plurality of test pads. The test pads are disposed on a second surface of the substrate. Each test pads has a test hole, a first isolation slot and a second isolation slot. The first isolation slot is disposed on the periphery of the test hole, and defines a signal region for connecting a signal terminal of a test probe. The second isolation slot is disposed on the periphery of the first isolation slot, and a ground region is defined between the first isolation slot and the second isolation slot. The ground region is used for connecting a ground terminal of the test probe. The test pad of the invention can match with the test probe so that the test probe can connect to the test pad for providing signal to the test probe. Therefore, the electrical test device can be utilized to easily measure the real electrical characteristic of the signal from the substrate.

Claims

1. An electrical test device having isolation slot comprising:

a substrate, having a first surface and a second surface; and

a plurality of test pads, disposed on the second surface of the substrate, each test pads having a test hole, a first isolation slot and a second isolation slot, the first isolation slot disposed on the periphery of the test hole, and defining a signal region for connecting a signal terminal of a test probe, the second isolation slot disposed on the periphery of the first isolation slot, a ground region defined between the first isolation slot and the second isolation slot, and the ground region for connecting a ground terminal of the test probe.

2. The electrical test device according to claim 1, wherein the first isolation slot and the second isolation slot are closed rings.

3. The electrical test device according to claim 1, wherein the signal region comprises the test hole and an annular test region, and the test hole electrically connects with the annular test region.

4. The electrical test device according to claim 1, wherein the first isolation slot is used to separate the signal region and the ground region.

5. The electrical test device according to claim 1, wherein the first isolation slot is annular and has a first diameter;

the second isolation slot is annular and has a second diameter;

the ground terminal of the test probe is annular and has a third diameter;

the second diameter is larger than the first diameter; and

the third diameter is between the first diameter and the second diameter.

6. The electrical test device according to claim 1, wherein the first isolation slot and the second isolation slot are concave corresponding to the annular signal region and the ground region.

7. The electrical test device according to claim 1, wherein the signal terminal of the test probe is disposed in the test hole and electrically connects with the test hole.

8. The electrical test device according to claim 1, further comprising a test probe, the test probe comprises a signal terminal and ground terminal;

the signal terminal of the test probe is disposed on center of the test probe; and

the ground terminal is annular and is disposed around the signal terminal of the test probe.