System and method for automatic masking of compressed scan chains with unbalanced lengths

• US 20060095818A1
• Filed: 11/04/2004
• Published: 05/04/2006
• Est. Priority Date: 11/04/2004
• Status: Active Grant

• Current Assignee: Avago Technologies International Sales Pte Limited (Broadcom, Inc.)
• Original Assignee: Avago Technologies General IP PTE Limited (Broadcom, Inc.)
• Inventors: Rearick, Jeffrey R., Bratt, John T.
• Granted Patent: US 7,143,324 B2
• Time in Patent Office: Days
• US Class Current: 714/726
• CPC Class Codes: G01R 31/318547 Data generators or compressors

Abstract

A scan test architecture is implemented. The scan test architecture provides a method of performing scan test of unbalanced scan chains. The scan test architecture generates a control signal (i.e., masking signal) to mask bits in an unbalanced scan chain. In one embodiment, the control signal is generated with a logic gate, a comparator, and a counter.

Claims

1. A method of performing scan test in a scan test architecture including at least one unbalanced scan chain including flip-flops, the method comprising the steps of:

incrementing a count;

comparing the count to a value representing the flip-flops in the at least one unbalanced scan chain; and

performing masking in response to comparing the count to the value representing the flip-flops in the at least one unbalanced scan chain.

2. A method of performing scan test as set forth in claim 1, wherein the step of comparing is performed using a fixed comparator value.

3. A method of performing scan test as set forth in claim 1, wherein the step of comparing is performed using a programmable comparator value.

4. A method of performing scan test as set forth in claim 1, wherein the step of comparing is performed using a learned comparator value.

5. A method of performing scan test as set forth in claim 1, wherein the step of masking is performed when the count equals the value.

6. A method of performing scan test as set forth in claim 1, wherein the at least one unbalanced scan chain includes at least two unbalanced scan chains and wherein the step of comparing is performed on each of the at least two unbalanced scan chains.

7. A method of performing scan test as set forth in claim 1, wherein the at least one unbalanced scan chain includes at least two unbalanced scan chains and wherein the step of masking is performed on each of the at least two unbalanced scan chains.

8. A method of performing scan test as set forth in claim 1, wherein zeros are generated in response to the step of masking.

9. A method of performing scan test as set forth in claim 1, wherein the step of masking further comprises the step of generating zeros from the at least one unbalanced scan chain.

10. A scan test system, comprising:

an unbalanced scan chain segment including flip-flops storing a test pattern;

a counter generating a count;

a comparator coupled to the counter and generating a comparator output in response to comparing the count to a value associated with the flip-flops; and

a gate coupled to the unbalanced scan chain segment and coupled to the comparator, the gate generating an output in response to the test pattern and in response to the comparator output.

11. A scan test system as set forth in claim 10, wherein the gate is an AND gate.

12. A scan test system as set forth in claim 10, further comprising an override system capable of overriding the first comparator.

13. A scan test system as set forth in claim 10, wherein the value associated with the flip-flops equals the number of flip-flops.

14. A system comprising:

a decompressor generating a test pattern;

a first unbalanced scan chain segment including first flip-flops, the first unbalanced scan chain segment coupled to the decompressor and storing first bits in response to the decompressor generating the test pattern;

a counter generating a count;

a first comparator coupled to the counter and generating a first comparator signal by comparing the count to a value representing the first flip-flops;

a first gate coupled to the first unbalanced scan chain segment and coupled to the first comparator, the first gate generating a first output in response to the first comparator signal; and

a compressor coupled to the first gate and generating a compressor output in response to the first output.

15. A system as set forth in claim 14, further comprising,

a second unbalanced scan chain segment including second flip-flops, the second unbalanced scan chain segment coupled to the decompressor and storing second bits in response to the decompressor generating the test pattern;

a second comparator coupled to the counter and generating a second comparator signal by comparing the count to a value representing the second flip-flops;

a second gate coupled to the first unbalanced scan chain segment and coupled to the second comparator, the second gate generating a second output in response to the second comparator signal; and

the compressor coupled to the second gate and generating the compressor output in response to the first output and in response to the second output.