Method and apparatus for calibrating a thermistor

• US 20060104330A1
• Filed: 11/15/2004
• Published: 05/18/2006
• Est. Priority Date: 11/15/2004
• Status: Active Grant

• Current Assignee: Palo Alto Research Center, Inc. (Xerox Holdings Corp.)
• Original Assignee: Palo Alto Research Center, Inc. (Xerox Holdings Corp.)
• Inventors: Littau, Karl A., Young, Michael Yu Tak, Ho Limb, Scott Jong
• Granted Patent: US 7,572,051 B2
• Time in Patent Office: Days
• US Class Current: 374/1
• CPC Class Codes: G01K 15/00 Testing or calibrating of thermometers
• CPC Class Codes: G01K 7/223 characterised by the shape of the resistive element
• CPC Class Codes: Y10T 29/49085 Thermally variable

Abstract

The presently described embodiments are directed to a calibration method and system for thin film thermistors that are locally heated with integrated thin film heaters. Initially, print head temperature is either measured or referenced. Then, transient thermistor resistances are measured and used to determine the thermistor resistance at a higher temperature. Notably, this calibration method is advantageously implemented as a step of an existing process without having to expose the print heads to operating temperatures. In some implementations of the presently described embodiments, trimming of the thermistors may be required once calibrated.

Claims

1. A method for calibrating a thermistor in a liquid drop ejector, the method comprising:

first measuring a first resistance of the thermistor at a first temperature;

heating the thermistor;

second measuring a transient resistance response of the thermistor through a range of varying temperatures;

generating a plot of thermistor resistance against thermistor temperature based on the first and second measuring; and

,

calculating an operating temperature resistance based on the plot.

2. The method as set forth in claim 1 wherein the heating comprises applying a constant voltage.

3. The method as set forth in claim 1 further comprising trimming the thermistor based on the operating temperature resistance.

4. A method for calibrating a thermistor in a liquid drop ejector, the method comprising:

first measuring a first resistance of the thermistor at a first temperature;

heating the thermistor;

second measuring a transient resistance response of the thermistor over time;

generating a plot of thermistor resistance against thermistor temperature based on the first and second measuring and temperature profile data; and

,

calculating an operating temperature resistance based on the plot.

5. The method as set forth in claim 4 wherein the heating comprises applying a constant power.

6. The method as set forth in claim 4 further comprising trimming the thermistor based on the operating temperature resistance.

11. The system as set forth in claim 4 wherein the means for heating comprises applying a constant power.

12. The system as set forth in claim 4 further comprising means for trimming the thermistor based on the operating temperature resistance.

7. A system for calibrating a thermistor in a liquid drop ejector, the system comprising:

means for first measuring a first resistance of the thermistor at a first temperature;

means for heating the thermistor;

means for second measuring a transient resistance response of the thermistor through a range of varying temperatures;

means for generating a plot of thermistor resistance against thermistor temperature based on the first and second measuring; and

,

means for calculating an operating temperature resistance based on the plot.

8. The system as set forth in claim 7 wherein the means for heating comprises means for applying a constant voltage.

9. The system method as set forth in claim 7 further comprising means for trimming the thermistor based on the operating temperature resistance.

10. A system for calibrating a thermistor in a liquid drop ejector, the system comprising:

means for first measuring a first resistance of the thermistor at a first temperature;

means for heating the thermistor;

means for second measuring a transient resistance response of the thermistor over time;

means for generating a plot of thermistor resistance against thermistor temperature based on the first and second measuring and temperature profile data; and

.

means for calculating an operating temperature resistance based on the plot.