IN-PROCESS VISION DETECTION OF FLAWS AND FOD BY BACK FIELD ILLUMINATION
First Claim
Patent Images
1. A flaw and foreign object debris (FOD) detection system for use during fabrication of a structure comprising:
- at least one illumination device configured to be in proximity with a fabrication system and illuminating a portion of the structure, said at least one illumination device directing light rays at said portion and at acute angles relative to said portion; and
at least one detector monitoring said portion and detecting FOD in said portion during fabrication of the structure in response to reflection of said light rays off of said portion.
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Accused Products
Abstract
A flaw and foreign object debris (FOD) detection system (11) for use during fabrication of a structure (12) includes an illumination device (13). The illumination device (13) is configured to be in proximity with a fabrication system (10) and illuminates a portion (18) of the structure (12). The illumination device (13) directs light rays (16) at acute angles relative to the portion (18). A detector (14) monitors the portion (18) and detects FOD in the portion (18) during fabrication of the structure (12) in response to the reflection of the light rays (16) off of the portion (18).
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Citations
40 Claims
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1. A flaw and foreign object debris (FOD) detection system for use during fabrication of a structure comprising:
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at least one illumination device configured to be in proximity with a fabrication system and illuminating a portion of the structure, said at least one illumination device directing light rays at said portion and at acute angles relative to said portion; and
at least one detector monitoring said portion and detecting FOD in said portion during fabrication of the structure in response to reflection of said light rays off of said portion. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A fabrication system comprising:
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a lamination system comprising a layer applicator applying a plurality of composite material layers to a substrate to form a structure; and
a flaw and foreign object debris (FOD) detection system proximate said lamination system comprising;
at least one illumination device illuminating a portion of the structure, said at least one illumination device directing light rays at said portion and at acute angles relative to said portion; and
at least one detector monitoring said portion and detecting FOD in said portion during application of said plurality of composite material layers in response to reflection of said light rays off of said portion. - View Dependent Claims (17, 18, 19, 20)
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21. A flaw and foreign object debris (FOD) detection system for use during fabrication of a structure comprising:
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at least one illumination device illuminating a portion of the structure, said at least one illumination device directing light rays having a single illumination level at said portion and at acute angles relative to said portion; and
at least one detector monitoring said portion and detecting at least one flaw and FOD simultaneously in said portion during fabrication of the structure in response to reflection of said light rays off of said portion. - View Dependent Claims (22, 23, 24, 25)
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26. A fabrication system comprising:
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a lamination system comprising a layer applicator applying a plurality of composite material layers to a substrate to form a structure; and
a flaw and foreign object debris (FOD) system proximate said lamination system comprising;
at least one illumination device illuminating a portion of the structure, said at least one illumination device directing light rays having a single illumination level at said portion and at acute angles relative to said portion; and
at least one detector monitoring said portion and detecting at least one flaw and FOD simultaneously in said portion during application of said plurality of composite material layers in response to reflection of said light rays off of said portion. - View Dependent Claims (27, 28, 29, 30)
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31. A method of detecting a flaw or a FOD in a structure during fabrication of that structure comprising:
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generating light rays;
directing said light rays at a portion of the structure and at acute angles relative to said portion;
monitoring said portion; and
detecting FOD in said portion during fabrication of the structure in response to reflection of said light rays off of said portion. - View Dependent Claims (32, 33, 34, 35)
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36. A method of fabricating a structure comprising:
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applying a plurality of composite material layers to a substrate to form a structure;
generating light rays;
directing said light rays at a portion of the structure and at acute angles relative to said portion;
monitoring said portion; and
detecting FOD in said portion during application of said plurality of composite material layers in response to reflection of said light rays off of said portion. - View Dependent Claims (37, 38, 39, 40)
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Specification