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Methods and apparatus for testing a component

  • US 20060109001A1
  • Filed: 11/19/2004
  • Published: 05/25/2006
  • Est. Priority Date: 11/19/2004
  • Status: Active Grant
First Claim
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1. A method for inspecting a component having a surface profile that includes a local minima and a local maxima, said method comprising:

  • positioning an eddy current probe proximate to a surface of the component to generate a first position indication;

    positioning the eddy current probe proximate to the surface of the component to generate a second position indication that is different than the first position indication; and

    interpolating between the first and second position indications to determine a profile of a portion of the surface of the component.

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