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Image sensor having resolution adjustment employing an analog column averaging/row averaging for high intensity light or row binning for low intensity light

  • US 20060113459A1
  • Filed: 11/30/2004
  • Published: 06/01/2006
  • Est. Priority Date: 11/23/2004
  • Status: Active Grant
First Claim
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1. A sensor resolution adjustment apparatus in communication with an array of sensors, wherein said array of sensors is organized in arrangements having a first dimension and a second dimension and has a plurality of sensor types arranged in a pattern to detect a phenomena and convert said phenomena to a conversion electrical signal, whereby each sensor type detects unique attributes of said phenomena, said sensor resolution adjustment apparatus adjusting sensor resolution for reception of the phenomena and comprising:

  • a sensor array decimation circuit in communication with said array of sensors to partition said array of sensors into a plurality of sub-groups of said array of sensors and generate partition control signals identifying addresses of said sub-groups;

    a first dimensional averaging circuit in communication with said array of sensors to receive said conversion electrical signals and in communication with said sensor array decimation circuit to receive said partition control signals, from said partition control signals averaging said conversion electrical signals from sensors detecting common attributes from the first dimension of each of said plurality of said sub-groups of said array of sensors to generate first dimensional averaged electrical signals of said first dimension of said plurality of said sub-group of said array of sensors;

    a second dimensional binning circuit;

    in communication with said first dimensional averaging circuit to receive said first dimensional averaged electrical signals of each sub-group of sensors that detect said common attributes arranged on said first dimension within each sub-group of the array of sensors, and in communication with said sensor array decimation circuit to receive said partition control signals and from said partition control signals integrating said first dimensional averaged electrical signals for sensors having said common attributes on the second dimension of each of said plurality of said sub-groups of said array of sensors to selectively generate second dimensional binning electrical signals for said second dimension of said plurality of said sub-group of sensors having common attributes of said array of sensors; and

    a second dimensional averaging circuit in communication with said first dimensional averaging circuit to receive said first dimensional averaged electrical signals of each sub-group of sensors that detect said common attributes arranged on said first dimension within each sub-group of the array of sensors, and in communication with said sensor array decimation circuit to receive said partition control signals and from said partition control signals to integrate said first dimensional averaged electrical signals for sensors having said common attributes on a second dimension of each of said plurality of said sub-groups of said array of sensors to selectively generate second dimensional averaged electrical signals of said second dimension of said plurality of said sub-group of sensors having common attributes of said array of sensors.

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