Granular type free layer and magnetic head

• US 20060114620A1
• Filed: 11/30/2004
• Published: 06/01/2006
• Est. Priority Date: 11/30/2004
• Status: Abandoned Application

• Current Assignee: TDK Corporation, Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Original Assignee: TDK Corporation, Kabushiki Kaisha Toshiba (Toshiba Corporation)
• Inventors: Sato, Isamu, Morita, Haruyuki, Sbiaa, Rachid
• Application Number:
  US10/998,660
• Publication Number:
  US 20060114620A1
• Time in Patent Office: Days
• US Class Current: 360/324.120
• CPC Class Codes: B82Y 10/00 Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
• CPC Class Codes: B82Y 25/00 Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
• CPC Class Codes: G11B 2005/3996 large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
• CPC Class Codes: G11B 5/3929 Disposition of magnetic thin films not used for directly coupling magnetic flux from the track to the MR film or for shielding
• CPC Class Codes: H10N 50/10 Magnetoresistive devices

Abstract

A reader of a magnetoresistive head includes a granular type free layer. The magnetoresistive head is for a current-perpendicular to plane type, and can be used in either a giant magnetoresistance (GMR) or ballistic magnetoresistance (BMR) scheme. The granular type free layer includes an insulating matrix, for example but not by way of limitation, Al₂O₃, and metal magnetic grains, for example but not by way of limitation, Ni, CoFe or NiFe. The metal grain size is about 10 to 30 nm, and the effect of having these grains interspersed in the insulative matrix is to provide a softer granular type free layer having a low magnetization. Accordingly, the granular type free layer of the present invention can be made thicker, on the order of about 5 to 10 nm, thus further improving overall thermal stability, reducing spin transfer effect and improving output read signal.

Claims

1. A magnetic element comprising:

a granular type free layer having a magnetization direction adjustable in response to an external field, said granular type free layer comprising a non-magnetic insulating matrix and magnetic grains that comprise a magnetic material disposed therein;

a pinned layer having a substantially fixed magnetization direction; and

a spacer sandwiched between said pinned layer and said granular type free layer.

2. The magnetic element of claim 1, wherein said magnetic grains have a cross section diameter of between about 10 nm and 30 nm.

3. The magnetic element of claim 1, wherein said granular type free layer has a thickness between about 5 nm and 10 nm.

4. The magnetic element of claim 1, wherein said pinned layer is a composed pinned layer having a first pinned sublayer in contact with said spacer and separated from a second pinned sublayer by a pinned layer spacer, said first pinned sublayer having a magnetization direction opposite to said second pinned sublayer.

5. The magnetic element of claim 1, farther comprising:

an antiferromagnetic (AFM) layer positioned adjacent to said pinned layer;

a buffer positioned adjacent to said AM layer; and

a cap positioned adjacent to said granular type free layer.

6. The magnetic element of claim 5, wherein said AFM layer comprises at least one of PtMn, IrMn, PtPcMn and FeMn.

7. The magnetic element of claim 1, wherein said spacer comprises one of (a) a conductive material and, (b) an insulating matrix with one of (i) at least one nano-path and (ii) at least one conductive material.

8. The magnetic element of claim 7, wherein said conductive material comprises one of Cu, Ag, and Cr.

9. The magnetic element of claim 7, wherein said insulating a matrix comprises at least one of an Al₂O₃, SiO₂ and Si₃N₄, and said nano-contact comprises at least one of Ni, Co, CoFe, and CoFeNi.

10. The magnetic element of claim 1, wherein said pinned layer comprises at least one of Co, Fe and Ni, and said magnetic grains comprise at least another of Co, Fe and Ni that is not present in said pinned layer.

11. The magnetic element of claim 1, said granular type free layer further comprising a free sublayer positioned adjacent to at least one of an upper surface and a lower surface of said granular type free layer.

12. The magnetic element of claim 11, wherein said free sublayer comprises a ferromagnetic material.

13. The magnetic element of claim 11, wherein said sub-free layer comprises a first continuous ferromagnetic sublayer above the granular type free layer, a free sublayer spacer above the first continuous ferromagnetic sublayer, and a second continuous ferromagnetic sublayer having an opposite direction of magnetization from the first continuous ferromagnetic sublayer, said second continuous ferromagnetic sublayer being positioned above the free sublayer spacer.

14. The magnetic element of claim 13, wherein the first continuous ferromagnetic free sublayer and the second continuous ferromagnetic free sublayer comprise one of Ni, Co, NiFe, CoFeNi and CoFe.

15. The magnetic element of claim 1, wherein said pinned layer comprises a pinned sublayer in contact with said spacer, a pinned layer spacer positioned opposite said spacer, and a hard magnet on a side of said pinned layer spacer opposite said pinned sublayer.

16. The magnetic element of claim 15, wherein said hard magnet comprises at least one of CoPt and CoCrPt.

17. The magnetic element of claim 1, wherein the granular type free layer has a coercivity of not more than about 20 Oe and a saturation magnetization not more than about 2.0 kG.

18. The magnetic element of claim 1, further comprising at least one of:

(a) a hard bias on at least one side of the magnetic element; and

(b) an in stack bias applied as a ferromagnetic layer above the granular type free layer, and separated from the granular type free layer by a non-magnetic exchange decoupling spacer.

19. The magnetic element of claim 1, wherein said magnetic element is one of a bottom type spin valve, a top type spin valve, and a dual type spin valve.

20. The magnetic element of claim 1, wherein said granular type free layer is made by one of plasma sputtering and ion beam deposition.

21. A device, comprising:

a granular type free layer having a magnetization direction adjustable in response to an external field, said granular type free layer comprising a non-magnetic insulating matrix and magnetic grains that comprise a magnetic material disposed therein;

a pinned layer having a substantially fixed magnetization direction; and

a spacer sandwiched between said pinned layer and said granular type free layer.