Instrument with interface for synchronization in automatic test equipment

• US 20060123296A1
• Filed: 02/22/2005
• Published: 06/08/2006
• Est. Priority Date: 11/22/2004
• Status: Active Grant

• Current Assignee: Teradyne Incorporated
• Original Assignee: Teradyne Incorporated
• Inventors: Reichert, Peter A.
• Granted Patent: US 7,319,936 B2
• Time in Patent Office: Days
• US Class Current: 714/731
• CPC Class Codes: G01R 31/319 Tester hardware, i.e. output processing circuits
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
• CPC Class Codes: G01R 31/31922 Timing generation or clock distribution G01R31/3191 takes precedence

Abstract

A test system with multiple instruments. Some instruments act as controller instruments and others act as controlled instruments. Each instrument includes a clock generator that synthesizes one or more local clocks from a reference clock. The reference clock is a relatively low frequency clock that can be inexpensively but accurately generated and distributed to all of the instruments. A communication link between instruments is provided. Timing circuits within instruments that are to exchange time information are synchronized to establish a common time reference. Thereafter, instruments communicate time dependent commands or status messages asynchronously over the communication link by appending to each message a time stamp reflecting a time expressed relative to the common time reference. The test system includes digital instruments that contain pattern generators that send command messages to analog instruments, which need not include pattern generators. The architecture simplifies design of analog instruments and avoids redesign of analog instrument as pattern rates of digital instruments change.

Claims

1. An instrument for an automatic test system in which a communication link carries messages, comprising:

a) an interface comprising;

i) a reference clock input;

ii) a port to connect to the communication link;

b) a clock generator, the clock generator coupled to the reference clock input and receiving a reference clock from the reference clock input and outputting a local clock;

c) a timing circuit, clocked by the local clock, having an input to receive a value representative of a time and an output, the timing circuit asserting the output at a time represented by the value received at the input; and

d) a message processing circuit having an input coupled to the port and an output coupled to the input of the timing circuit.

2. The instrument of claim 1 wherein the clock generator comprises a DDS circuit.

3. The instrument of claim 1 wherein the message processing circuit is adapted to receive packets asynchronously over the communication link.

4. The instrument of claim 1 wherein the port comprises a serial port.

5. The instrument of claim 1 wherein the interface, clock generator, timing circuit and message processing circuit are implemented as a single integrated circuit chip.

6. The instrument of claim 1 wherein the timing circuit includes a time-tracking sub-circuit that counts pulses of the local clock.

7. The instrument of claim 6 wherein the timing circuit comprises at least one comparator circuit having an output coupled to the output of the timing circuit, the comparator having a first input coupled to the output of the message processing circuit and a second input coupled to the time-tracking sub-circuit.

8. The instrument of claim 6 additionally comprising a second time tracking sub-circuit that counts pulses of the reference clock.

9. The instrument of claim 1 additionally comprising functional circuitry having a command input, coupled to the output of the timing circuit, wherein the functional circuitry executes a test function in response to a the output of the timing circuit being asserted.

10. The instrument of claim 1 wherein the interface additionally comprises a synchronization input and the clock generator includes circuitry to track periods of the reference clock starting at a time dictated by the synchronization input.

11. An integrated circuit comprising an interface adapted for use in an instrument for automatic test equipment having functional circuitry that executes a function in response to a command, comprising

a) a reference clock input;

b) a communication link input;

c) a command output;

d) a clock generator, the clock generator coupled to the reference clock input and outputting a local clock;

e) a timing circuit, clocked by the local clock, having an input to receive a value representative of a time and an output coupled to the command output, the timing circuit asserting the output at a time represented by a value applied to the input of the timing circuit; and

f) a message processing circuit having an input coupled to the communication link input and an output coupled to the input of the timing circuit.

12. The integrated circuit of claim 11 implemented as an ASIC.

15. The integrated circuit of claim 11 wherein the message processing circuit comprises a network interface.

16. The integrated circuit of claim 15 wherein the message processing circuit comprises an interface to a serial line in a network.

17. The integrated circuit of claim 11 wherein:

a) the clock generator includes an accumulator; and

b) the output of the message processing circuit includes a time stamp, the time stamp having at least a first field and a second field, each of the first field and the second field having values; and

c) the integrated circuit additionally comprises a circuit to compute a value based on the value of the first field and to load it into the accumulator at a time based on a value of the second field in response to an output of the timing circuit.

13. The integrated circuit of claim 111 wherein the timing circuit comprises a counter counting pulses of the local clock.

14. The integrated circuit of claim 13 wherein the timing circuit comprises a second counter counting pulses of a signal at the reference clock input.