RFID tag with bist circuits
First Claim
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1. An apparatus, comprising:
- an RFID tag comprising a receive signal path that flows from one or more primary inputs, said receive signal path to process an electrical receive signal originating from said inputs as a consequence of said inputs having received a wireless signal, said RFID tag also comprising a non-volatile memory, said non-volatile memory to store said RFID tag'"'"'s identification, said RFID tag including built-in-self-test (BIST) logic circuitry to test said non-volatile memory while said RFID tag is being tested on wafer.
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Abstract
Technologies suitable for on-wafer testing in the ubiquitous computing era are disclosed. Among the inventive features disclosed are: 1) clustering of wafer test probe landing area sites for parallel test sequencing; 2) on wafer test wiring that runs along the wafer'"'"'s scribe regions; 3) on-wafer test wiring that can be scribed and yet thwart the spread of contamination into the product die; 4) an RFID tag design that allows for on-wafer testing without imposing substantial semiconductor surface area penalty; 5) an RFID tag design that includes built-in self test (BIST) circuitry for the RFID tag'"'"'s non-volatile memory.
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Citations
18 Claims
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1. An apparatus, comprising:
an RFID tag comprising a receive signal path that flows from one or more primary inputs, said receive signal path to process an electrical receive signal originating from said inputs as a consequence of said inputs having received a wireless signal, said RFID tag also comprising a non-volatile memory, said non-volatile memory to store said RFID tag'"'"'s identification, said RFID tag including built-in-self-test (BIST) logic circuitry to test said non-volatile memory while said RFID tag is being tested on wafer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method, comprising:
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applying a supply voltage to an RFID tag that has not yet been diced from its wafer, said RFID tag comprising non-volatile memory and built-in-self-test (BIST) logic circuitry, said supply voltage applied to said RFID tag at a die edge of said RFID tag for purposes of testing said non volatile memory on wafer, said testing comprising;
said BIST logic circuitry generating a write data pattern; and
,writing said write data pattern into said non-volatile memory. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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Specification