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On wafer testing of RFID tag circuit with pseudo antenna signal

  • US 20060125508A1
  • Filed: 01/04/2006
  • Published: 06/15/2006
  • Est. Priority Date: 12/15/2004
  • Status: Abandoned Application
First Claim
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1. A method for testing at least a portion of a semiconductor wafer containing a plurality of RFID tag circuits, comprising:

  • propagating an excitation signal to a demodulator of a first one of the circuits, the excitation signal appearing on a net that couples an antenna port of the first circuit with the first circuit'"'"'s demodulator; and

    then dicing the first circuit from the wafer portion.

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