Network system for remotely controlling a tester

• US 20060129346A1
• Filed: 12/13/2005
• Published: 06/15/2006
• Est. Priority Date: 12/14/2004
• Status: Abandoned Application

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Lee, Kyu-Jeong
• Application Number:
  US11/301,550
• Publication Number:
  US 20060129346A1
• Time in Patent Office: Days
• US Class Current: 702/122
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Abstract

Disclosed is a network system and method for remotely controlling the automatic test equipment (or tester) in a semiconductor testing process. A plurality of clients remotely controls the tester through a server. The server comprises an operating system that is capable of communicating with various user interfaces and platforms. Accordingly, the tester may be remotely controlled, regardless of the particular platform of the client. Further, the tester may be remotely controlled on a web environment, as well as on a local area network linked to multiple workstations. The clients can also receive results of the tester to monitor the testing.

Claims

1. A network system testing a semiconductor device, comprising:

a network;

a tester examining the semiconductor device;

a server driving and controlling the tester; and

a plurality of clients connected to the server through the network, the plurality of clients comprising a user interface for accepting user data to remotely control the tester and for receiving results of the tester.

2. The network system as set forth in claim 1, wherein the server comprises an operating system, the operating system comprising an application for enabling the plurality of clients to remotely control the tester.

3. The network system as set forth in claim 2, wherein the operating system further comprises:

a driver actuating the tester; and

a library enabling the driver to control the tester.

4. The network system as set forth in claim 1, wherein the plurality of clients comprise client programs remotely controlling the tester through the network and monitoring a test result from the tester.

5. A network system testing a semiconductor device, comprising:

a tester for examining a semiconductor device; and

an operating system for remotely controlling the tester through a network;

wherein the operating system comprises (a) a server application for enabling platform-independent communication through the network, and (b) a driver for controlling the tester in response to user data received through the network.

6. The network system as set forth in claim 5, wherein the operating system further comprises (c) a tester application for enabling the driver to control the tester.

7. The network system as set forth in claim 5, further comprising:

a user interface for acquiring the user data from a user, for transmitting the user data to the operating system, and for receiving test results of the tester from the operating system.

8. The network system as set forth in claim 7, wherein the user interface comprises a plurality of clients operating a plurality of platforms.

9. The network system as set forth in claim 5, wherein the network comprises one of a wired network or a wireless network.

10. The network system as set forth in claim 5, wherein the network comprises an Internet.