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System and method for the analysis of semiconductor test data

  • US 20060136174A1
  • Filed: 12/21/2004
  • Published: 06/22/2006
  • Est. Priority Date: 12/21/2004
  • Status: Active Grant
First Claim
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1. A method of analyzing semiconductor test data, comprising:

  • receiving a plurality of raw data entries from a testing system, each raw data entry associated with a test structure of a semiconductor device, each raw data entry uniquely identified by a name including a plurality of parseable fields;

    parsing the plurality of data entries using a selected one of the plurality of parseable fields to identify a grouping of raw data entries;

    calculating at least one reportable parameter indicative of the functionality of the test structures associated with the grouping of raw data entries; and

    providing the at least one reportable parameter to a user.

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