Lithographic apparatus and device manufacturing method
First Claim
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1. A lithographic apparatus, comprising:
- an illumination system that conditions a radiation beam;
an array of individually controllable elements that pattern the beam;
a projection system that projects the patterned beam onto a target portion of a substrate and comprising an array of lenses arranged in a plane, such that each lens transmits a different part of the patterned beam;
a measuring device that measures a distance between a part of the substrate and a part of the array of lenses; and
an actuator that adjusts at least one of a position and a tilt of the array of lenses based on measurements by the measuring device.
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Abstract
A projection system comprises an array of lenses MLA, each lens transmitting a unique part of a patterned beam. Measuring devices measure a distance between the array of lenses MLA and a substrate W. A controller controls an actuator to adjust a position (e.g., height and/or tilt) of the microlens array MLA.
26 Citations
17 Claims
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1. A lithographic apparatus, comprising:
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an illumination system that conditions a radiation beam;
an array of individually controllable elements that pattern the beam;
a projection system that projects the patterned beam onto a target portion of a substrate and comprising an array of lenses arranged in a plane, such that each lens transmits a different part of the patterned beam;
a measuring device that measures a distance between a part of the substrate and a part of the array of lenses; and
an actuator that adjusts at least one of a position and a tilt of the array of lenses based on measurements by the measuring device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A device manufacturing method, comprising:
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(a) patterning a beam of radiation using an array of individually controllable elements;
(b) projecting the patterned beam onto a target portion of a substrate using a projection system;
(c) arranging an array of lenses arranged in a plane of the projection system, such that each lens in the array of lenses transmits a different part of the patterned beam;
(d) measuring a distance between the substrate and the array of lenses; and
(e) adjusting at least one of position and tilt of the array of lenses based on the measured distance. - View Dependent Claims (15, 16, 17)
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Specification