Energizable electrical test device for measuring current and resistance of an electrical circuit
First Claim
1. An electrical test device having multimeter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof, the electrical test device comprising:
- a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto;
a power supply interconnected between an external power source and the probe element;
a processor electrically connected to the probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal, the output signal being representative of at least one of the parameters of the electrical system; and
a display device electrically connected to the processor and configured to display a reading of the output signal, the reading being representative of the parameter;
wherein the electrical test device is configured to allow for selective powering of the electrical system upon energization of the probe element during measurement of the parameters.
6 Assignments
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Accused Products
Abstract
Provided is an electrical test device having multi-meter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters. The electrical test device comprises a conductor probe element, a power supply, a processor and a display device. The power supply is interconnected between an external power source and a probe element. The processor is connected to the probe element and is configured to provide an input signal to the electrical system and receive an output signal in response thereto. The output signal is representative of at least one of the parameters of the electrical system. The display device is configured to display reading the output signal which is representative of the parameter. The electrical device is configured to allow for selective powering of the electrical system upon energization of the probe element during measurement of the parameters.
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Citations
27 Claims
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1. An electrical test device having multimeter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof, the electrical test device comprising:
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a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto;
a power supply interconnected between an external power source and the probe element;
a processor electrically connected to the probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal, the output signal being representative of at least one of the parameters of the electrical system; and
a display device electrically connected to the processor and configured to display a reading of the output signal, the reading being representative of the parameter;
wherein the electrical test device is configured to allow for selective powering of the electrical system upon energization of the probe element during measurement of the parameters. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. An electrical test device having multimeter functionality and being adapted to provide current sourcing to an electrical system for selective measurement of a plurality of parameters thereof, the test device being configured to be switchable between one of an active mode and a passive mode respectively defined by measurement of the parameters with and without powering of the electrical system, the test device comprising:
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a conductive probe element configured to be placed into contact with the electrical system and provide an input signal thereto;
a power supply interconnected between an external power source and the probe element;
a processor electrically connected to the probe element and configured to manipulate the input signal provided to the electrical system and receive an output signal in response to the input signal, the output signal being representative of at least one of the parameters of the electrical system; and
a display device electrically connected to the processor and configured to display a reading of the output signal, the reading being representative of the parameter;
wherein the electrical test device is configured to allow for selective powering of the electrical system upon energization of the probe element during measurement of the parameters. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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Specification