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Method and apparatus for proximate CMOS pixels

  • US 20060146158A1
  • Filed: 12/30/2004
  • Published: 07/06/2006
  • Est. Priority Date: 12/30/2004
  • Status: Active Grant
First Claim
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1. An image sensor integrated circuit, comprising:

  • a plurality of photodetectors generating electrons excited by incident photons, each of the plurality of photodetectors including;

    an n-type region receiving the electrons excited by the energy of the photons;

    a plurality of nodes, wherein each of the plurality of photodetectors has a corresponding node of the plurality of nodes;

    a plurality of transfer devices controlling a transfer of the electrons from said each of the plurality of photodetectors to the corresponding node, each of the plurality of transfer devices including;

    a first terminal coupled to the n-type region of one of the plurality of photodetectors;

    a second terminal coupled to one of the plurality of nodes; and

    a control terminal receiving the control signal, wherein the transfer of the electrons occurs between the first terminal and the second terminal in response to a control signal of sufficient value applied to the control terminal;

    a first plurality of p-type regions having a first p-type concentration stronger than a background concentration, wherein each of the first plurality of p-type regions has a lateral shape surrounding multiple photodetectors of the plurality of photodetectors;

    a second plurality of p-type regions having a second p-type concentration stronger than the first p-type concentration;

    a plurality of reset devices in the second plurality of p-type regions, wherein each of the plurality of nodes has a corresponding reset device of the plurality of reset devices, and said each of the plurality of nodes is reset when the corresponding reset device is active;

    row and column circuitry; and

    a plurality of signal devices coupling the plurality of nodes to the row and column circuitry.

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