Device for multifocal confocal microscopic determination of spatial distribution and for multifocal fluctuation analysis of fluorescent molecules and structures with flexible spectral detection

• US 20060146325A1
• Filed: 01/04/2006
• Published: 07/06/2006
• Est. Priority Date: 01/06/2005
• Status: Active Grant

• Current Assignee: Leica Microsystems CMS GmbH (Danaher Corporation)
• Original Assignee: Leica Microsystems CMS GmbH (Danaher Corporation)
• Inventors: Heuvelman, Gerrit, Wachsmuth, Malte, Rippe, Karsten
• Granted Patent: US 7,724,363 B2
• Time in Patent Office: Days
• US Class Current: 356/318
• CPC Class Codes: G01J 3/14 using refracting elements, e.g. prisms G01J3/18, G01J3/26 take precedence prisms per se G02B5/04
• CPC Class Codes: G01J 3/36 Investigating two or more bands of a spectrum by separate detectors
• CPC Class Codes: G01N 21/6458 Fluorescence microscopy fluorescence microscopes per se G02B21/0076 and G02B21/16
• CPC Class Codes: G02B 21/0064 multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling G02B21/0076 takes precedence
• CPC Class Codes: G02B 21/0072 details concerning resolution or correction, including general design of CSOM objectives

Abstract

Many points on a sample are tested simultaneously in parallel in an FCS method with multifocal illumination and/or detection.

Claims

1. Device for FCS with multifocal illumination and/or detection.

2. Device according to claim 1, wherein many points on a sample may be tested simultaneously in parallel.

3. Device according to claim 1, wherein a spectrometer is provided.

4. Device according to claim 1, wherein one or several spectrally flexible, preferably continuously adjustable detection canals are provided.

5. Device according to claim 1, wherein the device comprises a microscope, in particular a confocal scanning microscope.

6. Device according to claim 1, wherein the device comprises a line scanning systems.

7. Device according to claim 6, characterized by multifocal construction, in particular of the line scanner, and by laterally structured illumination and/or interferometrically conditioned axial resolution improvement (e.g., 4-pi construction).

8. A confocal microscope with multifocal illumination and/or detection with detection in a spectrometer and one or several spectrally flexible, i.e., programmable, detection channels.

9. Confocal microscope according to claim 8, wherein many points on a sample may be tested simultaneously in parallel.

10. Confocal microscope according to claim 9, wherein a spectrometer is provided.

11. Confocal Microscope according to claim 8, wherein one or several spectrally flexible, preferably continuously adjustable detection channels are provided.

12. Confocal microscope according to claim 8, wherein the device comprises a line scanning system.

13. Confocal microscope according to claim 8, wherein multifocal construction, in particular of the line scanner, and by laterally structured illumination and/or interferometrically conditioned axial resolution improvement (e.g., 4-pi construction).

14. A Method comprising:

for FCS testing of a sample and providing multifocal illumination and/or detection.

15. Method according to claim 14, wherein many points on a sample may be tested simultaneously in parallel.

16. Method according to claim 14, wherein a spectrometer is provided for detection.

17. Method according to claim 14, wherein one or several spectrally flexible, preferably continuously adjustable detection channels are provided.

18. Method according to claim 14, wherein a microscope, in particular a confocal scanning microscope, is used.

19. Method according to claim 14, wherein the points to be tested all at once lie on the line.

20. Method according to claim 14, characterized by multifocal construction, in particular of the line scanner, and by laterally structured illumination and/or interferometrically conditioned axial resolution improvement (e.g., 4-pi construction).