Semiconductor device
First Claim
1. A semiconductor device, comprising a word line, a first bit line pair, a memory cell provided at an intersection of said word line and said first bit line pair, a second bit line pair, a switch circuit for coupling said first bit line pair and said second bit line pair, a sense amplifier including a first circuit connected to said first bit line pair and a second circuit connected to said second bit line pair, a first precharge circuit for precharging said first bit line pair to a first precharge potential and a second precharge circuit for precharging said second bit line pair to a second precharge potential, wherein said second circuit amplifies one of said first bit line pair and one of said second bit line pair to a first potential and the other of said first bit line pair and the other of said second bit line pair to a second potential from a storage signal of said memory cell, said first precharge potential is ranged between said first and second potentials, and said second precharge potential is said second potential.
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Accused Products
Abstract
The present invention provides a sense circuit for DRAM memory cell to cover the events that a sense time becomes remarkably longer when a power source voltage is lowered, a sense time under the low voltage condition becomes shorter when temperature rises and a sense time changes to a large extent for fluctuation of processes. The present invention provides the following typical effects. A switch means is provided between the bit line BL and local bit line LBL connected to the memory cells for isolation and coupling of these bit lines The bit line BL is precharged to the voltage of VDL/2, while the local bit line LBL is precharged to the voltage of VDL. The VDL is the maximum amplitude voltage of the bit line BL. A sense amplifier SA comprises a first circuit including a differential MOS pair having the gate connected to the bit line BL and a second circuit connected to the local bit line LBL for full amplitude amplification and for holding the data. When the bit line BL and local bit line LBL are capacitance-coupled via a capacitor, it is recommended to use a latch type sense amplifier SA connected to the local bit line LBL.
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Citations
2 Claims
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1. A semiconductor device, comprising a word line, a first bit line pair, a memory cell provided at an intersection of said word line and said first bit line pair, a second bit line pair, a switch circuit for coupling said first bit line pair and said second bit line pair, a sense amplifier including a first circuit connected to said first bit line pair and a second circuit connected to said second bit line pair, a first precharge circuit for precharging said first bit line pair to a first precharge potential and a second precharge circuit for precharging said second bit line pair to a second precharge potential, wherein
said second circuit amplifies one of said first bit line pair and one of said second bit line pair to a first potential and the other of said first bit line pair and the other of said second bit line pair to a second potential from a storage signal of said memory cell, said first precharge potential is ranged between said first and second potentials, and said second precharge potential is said second potential.
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2-22. -22. (canceled)
Specification