Electrical connection system for an electrochemical analysis system

• US 20060152207A1
• Filed: 12/06/2005
• Published: 07/13/2006
• Est. Priority Date: 12/15/2004
• Status: Active Grant

• Current Assignee: Roche Diagnostics Operations Incorporated (Roche Holding AG)
• Original Assignee: Roche Diagnostics Operations Incorporated (Roche Holding AG)
• Inventors: Augstein, Manfred, Wieder, Herbert, Riebel, Stefan, Thoes, Bruno Robert, Bainczyk, Gregor
• Granted Patent: US 7,754,152 B2
• Time in Patent Office: Days
• US Class Current: 324/71.100
• CPC Class Codes: G01N 33/4875 Details of handling test elements, e.g. dispensing or storage, not specific to a particular test method test-elements per se B01L, automatic analysers G01N35/00, in-vivo analysis on the human body for medical diagnosis A61B
• CPC Class Codes: Y10T 29/49002 Electrical device making

Abstract

The invention relates to an electrical connection system for an analysis system and a method for analysis of a liquid sample on an analytical test element using the described analysis system. The analysis system comprises an evaluation appliance for evaluation of electrical signals, a test element holder for holding and positioning of an analytical test element in a measurement position, and at least one electrical contact element configured to make electrical contact with at least one electrical contact surface of an analytical test element, and to produce an electrical connection between the contact surface and the evaluation appliance. The at least one contact element is arranged to move to contact the contact surface of a test element held either in a fixed test element holder or a moveable test element holder, such as a slide. Furthermore, the analysis system has a means for moving the electrical contact element to the electrical contact surface of an analytical test element when the test element holder is in the measurement position.

Claims

1. An analysis system for analysis of a liquid sample on an analytical test element, comprising an evaluation appliance for evaluation of electrical signals, a test element holder configured to hold and position an analytical test element in a measurement position within the analysis system, and at least one electrical contact element configured to make electrical contact with at least one electrical contact surface of an analytical test element provided in the test element holder to produce an electrical connection between the contact surface and the evaluation appliance, wherein the at least one contact element is arranged such that it can move relative to the test element holder, and wherein the analysis system has a means for moving the electrical contact element into contact with the contact surface when the test element is positioned in the measurement position in the test element holder.

2. The analysis system of claim 1, wherein the contact element is moveable at substantially right angles to the contact surface.

3. The analysis system of claim 2, wherein the means for moving the contact element comprises rotary movement of the contact element towards the contact surface.

4. The analysis system of claim 1, further comprising a housing, the test element holder and the contact element being provided in said housing, and the test element holder being moveable relative to the housing.

5. The analysis system of claim 4, the test element holder and the contact element comprising an electrical connection system for producing an electrical connection between the evaluation appliance and a test element held within the test element holder, the test element holder comprising a slide that is moveable between an initial position and an end position within the housing, the end position comprising the measurement position, the slide defining a holding space bounded by a stop and configured to receive a test element through an inlet opening in the slide, wherein the electrical connection system is configured such that the contact element is set at a distance from the contact surface of the test element when the test element is held in the holding space and the slide is in the initial position, and such that the means for moving the contact element causes the contact element to be pressed against the contact surface when the slide is in the end position in order to produce and electrical connection between the contact surface and the evaluation appliance.

6. The analysis system of claim 5, the contact element being at least partially mounted on the slide.

7. The analysis system of claim 6, the contact element being mounted on the slide and recessed relative to the test element in a depression in the holding space when the slide is in the initial position.

8. The analysis system of claim 7, the contact element extending through and being moveably maintained within an opening in the slide, the means for moving the contact element comprising a contact-pressure element fixedly mounted within the housing and outside the slide.

9. The analysis system of claim 8, the contact-pressure element having a guide surface configured to displace the contact element into the holding space toward the contact surface as the slide is moved from the initial position to the end position.

10. The analysis system of claim 9, the contact-pressure element comprising an inclined plane configured to guide the contact element as the slide is moved from the initial position to the end position.

11. The analysis system of claim 8, the contact-pressure element comprising an electrically conductive material and being in electrical communication with the evaluation appliance.

12. The analysis system of claim 6, the contact element also being partially fixedly mounted on the housing and being resiliently flexible and configured such that movement of the slide from the initial position to the end position resiliently deforms the contact element into contact with the contact surface.

13. The analysis system of claim 6, the contact element also being resiliently flexible and comprising one end that contacts an electrical contact in electrical communication with the evaluation appliance when the slide is in the end position, and an other end that is resiliently deformed toward the contact surface when the slide is in the end position by a contact-pressure element fixedly mounted to the housing, the contact-pressure element comprising the means for moving the contact element.

14. The analysis system of claim 6, the contact element being rotatably mounted to the slide, the means for moving the contact element comprising an electrical contact in electrical communication with the evaluation appliance, the contact element comprising one end that contacts the electrical contact when the slide is in the end position and which contacting causes an other end of the contact element to rotate towards the contact surface.

15. The analysis system of claim 1, further comprising a housing, the test element holder and the contact element being provided with the housing, and the test element holder being fixed relative to the housing.

16. The analysis system of claim 15, further comprising a test element magazine for holding at least two test elements, and a test element removal device for removal of a test element from the test element magazine and for transport of the test element to the measurement position in the test element holder.

17. The analysis system of claim 16, the test element removal device comprising a drive operatively connected to the means for movement of the contact element.

18. The analysis system of claim 16, wherein the contact element comprises a toggle lever, and the means for moving the contact element comprises a rod moveable in the substantially longitudinal direction and having a rod end by means of which the contact element can be moved to the contact surface of a test element which is positioned in the measurement position in the test element holder.

19. The analysis system of claim 1, wherein the evaluation appliance comprises an electrochemical evaluation circuit configured to perform analysis of the liquid sample on the test element based at least partially on the electrical signals transmitted from the test element.

20. A method for analysis of a liquid sample on an analytical test element, comprising the steps of:

moving the analytical test element to a measurement position in a test element holder in an analysis system;

moving a contact element relative to the test element holder towards a contact surface of the test element in order to make electrical contact with the analytical test element and in order to produce an electrical connection between the contact surface and an evaluation appliance; and

, using the evaluation appliance, evaluating an electrical signal which is transmitted from the test element via the contact surface and the contact element.

21. The method of claim 20, wherein the test element holder is fixed relative to a housing for containing the analysis system.

22. A method for electrical connection of a contact surface of a test element in an evaluation appliance for an analysis system, comprising the steps of:

inserting the test element into a holding space as far as a stop in a slide which is arranged in a housing, the slide being moveable between an initial position and an end position, the slide being located in the initial position at the inserting step and a contact element being provided in the evaluation appliance and set at a distance from the contact surface when the slide is in the initial position; and

moving the slide with the test element contained in it from the initial position into the end position, with the contact element being moved towards the contact surface of the test element and pressed against the contact surface when the slide is moved into the end position.