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Method and apparatus for inspection of high frequency and microwave hybrid circuits and printed circuit boards

  • US 20060152232A1
  • Filed: 02/14/2003
  • Published: 07/13/2006
  • Est. Priority Date: 12/20/2002
  • Status: Abandoned Application
First Claim
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1. A method of assessing the operation of a device under test (DUT) at high and microwave frequencies comprising using an antenna terminating in a tip or apex to acquire microwave electromagnetic field measurements in a near field region of a test point of the DUT comprising the steps of:



  • siting the antenna in a test position with its tip at a predetermined distance and at a predetermined inclination to the test point;

    energising the DUT; and

    measuring and recording a microwave property of the DUT.

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