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Methods and systems for testing materials

  • US 20060153739A1
  • Filed: 01/13/2005
  • Published: 07/13/2006
  • Est. Priority Date: 01/13/2005
  • Status: Abandoned Application
First Claim
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1. A testing system for evaluating a material sample, said testing system comprising:

  • a material sample holder comprising a first flange comprising an aperture extending therethrough, a second flange comprising an aperture extending therethrough, said first and second flanges each comprise a sample face configured to frictionally retain a material sample therebetween;

    a respective waveguide coupled to a first end of each of said first flange and said second flange, each said waveguide configured to direct electromagnetic waves through respective said flange apertures;

    a respective waveguide adapter communicatively coupled to a second end of each waveguide; and

    a control unit electrically coupled to each said waveguide adapter, said control unit configured to control said waveguide adapter to transmit and receive electromagnetic wave signals.

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