Methods and systems for testing materials

• US 20060153739A1
• Filed: 01/13/2005
• Published: 07/13/2006
• Est. Priority Date: 01/13/2005
• Status: Abandoned Application

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Baucke, Russell Craig, D' Angelo, John, Decker, Timothy, Hilderbrand, Glen David, Nelson, John W. Jr.
• Application Number:
  US11/034,566
• Publication Number:
  US 20060153739A1
• Time in Patent Office: Days
• US Class Current: 422/82.110
• CPC Class Codes: G01N 22/00 Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more G01N3/00 - G01N17/00, G01N24/00 take precedence

Abstract

Methods and systems for evaluating a material sample is provided. The system includes a material sample holder including a first flange having an aperture therethrough, a second flange having an aperture therethrough, the first and second flanges configured to frictionally hold a material sample sandwiched therebetween, a waveguide coupled to a first end of each of the first flange and the second flange, each waveguide configured to direct electromagnetic waves through respective apertures, a waveguide adapter communicatively coupled to a second end of each waveguide, and a control unit electrically coupled to the wave source, the control unit configured to control the waveguide adapter to transmit and receive electromagnetic wave signals.

Claims

1. A testing system for evaluating a material sample, said testing system comprising:

a material sample holder comprising a first flange comprising an aperture extending therethrough, a second flange comprising an aperture extending therethrough, said first and second flanges each comprise a sample face configured to frictionally retain a material sample therebetween;

a respective waveguide coupled to a first end of each of said first flange and said second flange, each said waveguide configured to direct electromagnetic waves through respective said flange apertures;

a respective waveguide adapter communicatively coupled to a second end of each waveguide; and

a control unit electrically coupled to each said waveguide adapter, said control unit configured to control said waveguide adapter to transmit and receive electromagnetic wave signals.

2. A testing system in accordance with claim 1 wherein said material sample holder is configured to hold a material sample that completely covers both said apertures.

3. A testing system in accordance with claim 1 wherein said material sample holder is configured to hold a radio frequency absorbent material.

4. A testing system in accordance with claim 1 wherein said material sample holder is configured to hold a pliable material.

5. A testing system in accordance with claim 1 wherein said material sample holder is configured to hold a compressible material.

6. A testing system in accordance with claim 1 wherein said control unit is configured to control said waveguide adapters such that when said waveguide adapter associated with said first flange is transmitting, said waveguide adapter associated with said second flange is receiving.

7. A testing system in accordance with claim 1 wherein said control unit is configured to control said waveguide adapters such that when said waveguide adapter associated with said first flange is transmitting a standing radio frequency wave, said waveguide adapter associated with said second flange is receiving radio frequency energy transmitted through a material sample.

8. A testing system in accordance with claim 1 wherein said control unit is configured to determine a reflection loss of a material sample held in said material sample holder using a radio frequency return signal.

9. A material sample holder for testing an electromagnetic energy absorbent material, said material sample holder comprising:

a first flange comprising a face and an aperture therethrough, said first flange configured to mate to a first surface of a material sample; and

a second flange comprising a face and an aperture therethrough, said second flange configured to mate to a second surface of a material sample;

said first and said second flanges configured to sandwich the material sample such that said face of said first flange engages said first surface and said face of said second flange engages said second surface.

10. A material sample holder in accordance with claim 9 wherein said first flange is configured to couple to a first waveguide such that said first flange aperture is in substantial alignment with a bore of said first waveguide.

11. A material sample holder in accordance with claim 9 wherein said second flange is configured to couple to a second waveguide such that said second flange aperture is in substantial alignment with a bore of said second waveguide.

12. A material sample holder in accordance with claim 9 wherein said first and said second flange apertures are configured to be completely covered by the material sample when said material sample holder is assembled.

13. A material sample holder in accordance with claim 9 wherein said first and said second flanges are configured to exert a clamping force on the material sample to maintain a frictional engagement between said first and said second flanges and the material sample.

14. A material sample holder in accordance with claim 9 wherein the material sample is compressible, said first and said second flanges configured to exert a clamping force on the material sample to maintain an interference fit between a portion of the material sample that is expanded by the clamping force and said first and said second flange apertures.

15. A method of evaluating a material sample, said method comprising:

sandwiching a material sample between a transmitting waveguide flange having an aperture therethrough in communication with a transmitting waveguide and a receiving waveguide flange having an aperture therethrough in communication with a receiving waveguide, the apertures configured to be completely covered by the material sample when the sample is installed in the flanges;

emitting an electromagnetic wave through the transmitting waveguide to the material sample;

receiving electromagnetic energy from the electromagnetic wave through the sample; and

determining a material property of the material sample using the emitted wave and the received energy.

16. A method in accordance with claim 15 wherein sandwiching a material sample comprises overlapping the material sample with each flange such that a portion of the material sample extends radially past an outer periphery of each aperture.

17. A method in accordance with claim 15 wherein emitting an electromagnetic wave through the transmitting waveguide comprises emitting an electromagnetic wave through a waveguide adapter coupled to an end of the transmitting waveguide opposite the transmitting waveguide flange.

18. A method in accordance with claim 15 wherein receiving electromagnetic energy from the electromagnetic wave comprises receiving an electromagnetic wave through a waveguide adapter coupled to an end of the receiving waveguide opposite the receiving waveguide flange.

19. A method in accordance with claim 15 wherein determining a material property of the material sample using the emitted wave and the received energy comprises:

controlling a frequency and power magnitude of the electromagnetic wave using an analyzer electrically coupled to the transmitting waveguide adapter;

receiving energy transmitted through the material sample at the receiving waveguide adapter; and

receiving energy reflected from the material sample at the transmitting waveguide adapter.

20. A method in accordance with claim 15 further comprising substantially blocking the emitted electromagnetic wave from impinging the receiving waveguide adapter using the material sample.