Test apparatus and test method
First Claim
1. A testing apparatus for performing a testing on a device under test (DUT) comprising:
- a performance board on which the DUT is mounted;
a main frame for generating a test signal for testing the DUT and determining pass/fail of the DUT on the basis of an output signal output by the DUT;
a pin electronics which is provided between said main frame and said performance board and performs sending and receiving signals between said main frame and the DUT;
a deterministic jitter injecting unit for receiving the output signal without passing through said pin electronics and inputting a loop signal, which is the received output signal into which a deterministic jitter is injected, to an input pin of the DUT without passing through said pin electronics; and
a switching unit for determining whether the input pin of the DUT is provided with the test signal output by said pin electronics or the loop signal output by said deterministic jitter injecting unit.
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Accused Products
Abstract
A testing apparatus for performing a testing on a device under test (DUT) is provided, wherein the testing apparatus includes a performance board on which the DUT is mounted; a main frame for generating a test signal for testing the DUT and determining pass/fail of the DUT on the basis of an output signal output by the DUT; a pin electronics which is provided between the main frame and the performance board and performs sending and receiving signals between the main frame and the DUT; a deterministic jitter injecting unit for receiving the output signal without passing through the pin electronics and inputting a loop signal, which is the received output signal into which a deterministic jitter is injected, to an input pin of the DUT without passing through the pin electronics; and a switching unit for determining whether the input pin of the DUT is provided with the test signal output by the pin electronics or the loop signal output by the deterministic jitter injecting unit.
31 Citations
21 Claims
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1. A testing apparatus for performing a testing on a device under test (DUT) comprising:
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a performance board on which the DUT is mounted;
a main frame for generating a test signal for testing the DUT and determining pass/fail of the DUT on the basis of an output signal output by the DUT;
a pin electronics which is provided between said main frame and said performance board and performs sending and receiving signals between said main frame and the DUT;
a deterministic jitter injecting unit for receiving the output signal without passing through said pin electronics and inputting a loop signal, which is the received output signal into which a deterministic jitter is injected, to an input pin of the DUT without passing through said pin electronics; and
a switching unit for determining whether the input pin of the DUT is provided with the test signal output by said pin electronics or the loop signal output by said deterministic jitter injecting unit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. A testing method for performing a jitter testing on a device under test (DUT) by using a testing apparatus comprising a performance board on which the DUT is mounted;
- a main frame for generating a test signal for testing the DUT and determining pass/fail of the DUT on the basis of an output signal output by the DUT;
a pin electronics which is provided between said main frame and said performance board and performs sending and receiving signals between said main frame and the DUT; and
a switching unit for determining whether or not said pin electronics is connected to the DUT, comprising;
a switch control step of making said stitching unit disconnect said pin electronics and the DUT; and
a deterministic jitter injecting step of receiving the output signal without passing through said pin electronics and inputting a loop signal, which is the received output signal into which a deterministic jitter is injected, to an input pin of the DUT without passing through said pin electronics.
- a main frame for generating a test signal for testing the DUT and determining pass/fail of the DUT on the basis of an output signal output by the DUT;
Specification