RFID application test systems and methods

• US 20060202705A1
• Filed: 03/08/2006
• Published: 09/14/2006
• Est. Priority Date: 03/14/2005
• Status: Active Grant

• Current Assignee: Avery Dennison Retail Information Services LLC (Avery Dennison Corporation)
• Original Assignee: Avery Dennison Corporation
• Inventors: Forster, Ian J.
• Granted Patent: US 7,477,152 B2
• Time in Patent Office: Days
• US Class Current: 340/572.800
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/312 by capacitive methods

Abstract

Systems and methods are disclosed herein to provide location determination for the application of radio frequency identification (RFID) devices (e.g., performance evaluation of one or more RFID devices for various locations on an object to be associated with an RFID device). For example, in accordance with an embodiment of the present invention, an RFID test device includes a housing, an RFID device coupled to the housing, and a near field coupler contained at least partially within the housing and configured to communicate in a near field region with the RFID device.

Claims

1. A radio frequency identification (RFID) test device comprising:

a housing;

an RFID device coupled to the housing;

a near field coupler contained at least partially within the housing and configured to communicate in a near field region with the RFID device; and

a communication path coupled to the near field coupler.

2. The RFID test device of claim 1, further comprising an RFID reader coupled to the communication path and adapted to communicate with the RFID device through the near field coupler.

3. The RFID test device of claim 1, wherein the RFID device comprises at least one of an RFID tag, an RFID label, an RFID chip, an RFID strap, and an RFID inlay.

4. The RFID test device of claim 1, wherein the near field coupler communicates with the RFID device in the near field region of the RFID device by at least one of an electric field and a magnetic field.

5. The RFID test device of claim 1, wherein the housing comprises a low dielectric constant material.

6. The RFID test device of claim 1, wherein the housing comprises a first section comprising a low dielectric constant material and a second section comprising a radio frequency absorbing material.

7. The RFID test device of claim 1, wherein the housing comprises a material having one or more parameters comprising at least one of an average dielectric constant, a relative magnetic permeability, and a radio frequency energy loss, with the one or more parameters varying relative to a distance from the RFID device.

8. A radio frequency identification (RFID) system comprising:

an RFID device;

a coupler adapted to communicate in a near field region with the RFID device;

means for housing the coupler in close proximity to the RFID device coupled to the housing means;

a communication path coupled to the coupler; and

an RFID reader coupled to the communication path and adapted to communicate with the RFID device through the coupler.

9. The RFID system of claim 8, wherein the coupler communicates with the RFID device in the near field region of the RFID device by at least one of an electric field and a magnetic field.

10. The RFID system of claim 8, wherein the RFID device comprises at least one of an RFID tag, an RFID label, an RFID chip, an RFID strap, and an RFID inlay.

11. The RFID system of claim 8, wherein the housing means is adapted to be held to position the RFID device at one or more locations relative to an object.

12. The RFID system of claim 11, wherein the RFID reader is adapted to determine a performance of the RFID device at the one or more locations.

13. The RFID system of claim 12, wherein the RFID reader provides an audible tone indicating the performance of the RFID device.

14. The RFID system of claim 8, further comprising means for moving the RFID device to one or more locations on or relative to an object and determining a performance of the RFID device at the one or more locations.

15. A method of determining a mounting location on an object for a first radio frequency identification (RFID) device, wherein the first RFID device is coupled to a near field test device to determine the mounting location, the method comprising:

moving the first RFID device, coupled to the near field test device, to a first location associated with the object;

communicating with the first RFID device in the near field region with the near field test device to determine the performance of the first RFID device at the first location; and

moving the first RFID device, coupled to the near field test device, to a second location associated with the object; and

communicating with the first RFID device in the near field region with the near field test device to determine the performance of the first RFID device at the second location.

16. The method of claim 15, wherein the near field test device communicates with the first RFID device in the near field region through at least one of an electric field and a magnetic field.

17. The method of claim 15, wherein the performance is determined based on at least one of a read rate and a power level.

18. The method of claim 15, further comprising comparing the performance of the first RFID device at the first location and the second location to determine the mounting location.

19. The method of claim 15, further comprising:

comparing the performance of the first RFID device at the first location and the second location to determine the mounting location;

mounting at least one of the first RFID device and a similar one of the first RFID devices at the determined mounting location; and

performing a far field test to verify the performance at the determined mounting location.

20. The method of claim 15, further comprising:

removing the first RFID device from the near field test device;

coupling a second RFID device to the near field test device;

moving the second RFID device, coupled to the near field test device, to the first location;

communicating with the second RFID device in the near field region with the near field test device to determine the performance of the second RFID device at the first location; and

moving the second RFID device, coupled to the near field test device, to the second location; and

communicating with the second RFID device in the near field region with the near field test device to determine the performance of the second RFID device at the second location.

21. The method of claim 20, further comprising comparing the performance of the first RFID device at the first location and the second location to the performance of the second RFID device at the first location and the second location to determine the mounting location and determine which of the first RFID device and the second RFID device to mount at the determined mounting location.

22. The method of claim 15, wherein the first location and the second location are on a surface of the object.