Image Display Device and Method of Testing the Same
First Claim
Patent Images
1. A display device comprising:
- a display region comprising a first pixel over a substrate, the first pixel comprising;
a data signal line;
a first scanning line;
a display element; and
a first circuit electrically connected to the data signal line for driving the display element wherein the first circuit includes at least a first thin film transistor having a gate electrode electrically connected to the first scanning line;
a testing region comprising a second pixel over the substrate, the second pixel comprising;
a second scanning line;
a second circuit electrically connected to the data signal of the display region wherein the second circuit includes at least a second thin film transistor having a gate electrode electrically connected to the second scanning line; and
a testing terminal electrically connected to the second circuit.
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Abstract
It is the object of the present invention to provide a simple and accurate testing circuit and a testing method while occupying as small space as possible in an image display device. By partly changing dummy pixels arranged in the periphery of a display region into a testing circuit, tests for detecting broken wires in data signal lines and scanning lines and whether pixels are controlled adequately can be conducted easily and accurately, occupying as small space as possible without a need of an additional complicated circuit. Accordingly, a display panel can be produced at a low cost.
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Citations
20 Claims
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1. A display device comprising:
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a display region comprising a first pixel over a substrate, the first pixel comprising;
a data signal line;
a first scanning line;
a display element; and
a first circuit electrically connected to the data signal line for driving the display element wherein the first circuit includes at least a first thin film transistor having a gate electrode electrically connected to the first scanning line;
a testing region comprising a second pixel over the substrate, the second pixel comprising;
a second scanning line;
a second circuit electrically connected to the data signal of the display region wherein the second circuit includes at least a second thin film transistor having a gate electrode electrically connected to the second scanning line; and
a testing terminal electrically connected to the second circuit. - View Dependent Claims (2, 3, 4, 5)
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6. A display device comprising:
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a display region comprising;
first and second pixels over a substrate;
a first data signal line and a second data signal line extending in parallel;
a first scanning line extending across the first data signal line and the second data signal line;
a first display element of the first pixel and a second display element of the second pixel; and
a first circuit electrically connected to the first data signal line for driving the first display element wherein the first circuit includes at least a first thin film transistor having a gate electrode electrically connected to the first scanning line;
a second circuit electrically connected to the second data signal line for driving the second display element wherein the second circuit includes at least a second thin film transistor having a gate electrode electrically connected to the first scanning line;
a testing region comprising;
third and fourth pixels over the substrate;
a second scanning line extending across the first and second data lines;
a third circuit electrically connected to the first data signal line wherein the third circuit includes at least a third thin film transistor having a gate electrode electrically connected to the second scanning line;
a fourth circuit electrically connected to the second data signal line wherein the fourth circuit includes at least a fourth thin film transistor having a gate electrode electrically connected to the second scanning line; and
a testing terminal electrically and commonly connected to the third and fourth circuits. - View Dependent Claims (7, 8, 9, 10)
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11. A testing method of a display device comprising:
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a display region comprising a first pixel over a substrate, the first pixel comprising;
a data signal line;
a first scanning line;
a display element; and
a first circuit electrically connected to the data signal line for driving the display element wherein the first circuit includes at least a first thin film transistor having a gate electrode electrically connected to the first scanning line;
a testing region comprising a second pixel over the substrate, the second pixel comprising;
a second scanning line;
a second circuit electrically connected to the data signal of the display region wherein the second circuit includes at least a second thin film transistor having a gate electrode electrically connected to the second scanning line; and
a testing terminal electrically connected to the second circuit, said method comprising steps of;
selecting the second scanning line;
supplying a signal to the data line while selecting the second scanning line; and
observing an output of the testing terminal. - View Dependent Claims (12, 14, 15, 16)
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13. A display device comprising:
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a display region comprising a first pixel over a substrate, the first pixel comprising;
a data signal line;
a scanning line;
a display element; and
a first circuit electrically connected to the data signal line for driving the display element wherein the first circuit includes at least a first thin film transistor having a gate electrode electrically connected to the scanning line;
a testing region comprising a second pixel over the substrate, the second pixel comprising;
a second circuit including at least a second thin film transistor having a gate electrode electrically connected to the first scanning line; and
a testing terminal electrically connected to the second circuit.
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17. A display device comprising:
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a display region comprising;
a first pixel and a second over a substrate;
a data signal line;
a first scanning line and a second scanning line, each extending across the data signal line;
a first display element for the first pixel and a second display element for the second pixel; and
a first circuit electrically connected to the data signal line for driving the first display element wherein the first circuit includes at least a first thin film transistor having a gate electrode electrically connected to the first scanning line;
a second circuit electrically connected to the data signal line for driving the second display element wherein the second circuit includes at least a second thin film transistor having a gate electrode electrically connected to the second scanning line;
a testing region comprising;
a third circuit including at least a third thin film transistor having a gate electrode electrically connected to the first scanning line;
a first testing terminal electrically connected to the third circuit;
a fourth circuit including at least a fourth thin film transistor having a gate electrode electrically connected to the second scanning line;
a second testing terminal electrically connected to the fourth circuit, wherein the first testing terminal and the second testing terminal are separated from each other. - View Dependent Claims (18, 19)
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20. A testing method of a display device comprising:
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a display region comprising a first pixel over a substrate, the first pixel comprising;
a data signal line;
a scanning line;
a display element; and
a first circuit electrically connected to the data signal line for driving the display element wherein the first circuit includes at least a first thin film transistor having a gate electrode electrically connected to the scanning line;
a testing region comprising a second pixel over the substrate, the second pixel comprising;
a second circuit including at least a second thin film transistor having a gate electrode electrically connected to the first scanning line; and
a testing terminal electrically connected to the second circuit, said method comprising steps of;
selecting the scanning line;
supplying a voltage to the second thin film transistor when the scanning line is selected; and
observing an output of the testing terminal.
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Specification